Optische Spektroskopie
Application Notes
- Characterization of Semiconductors with Photoluminescence Measurement system
- Semiconductor Characterization by Photoreflectance Spectroscopy
- Combined Spectroscopic Analyses of Semiconductor Material Structures at the Microscopic Level
- Raman and PL Characterization of GaN
- Pulsed Plasma Monitoring
- PL/PLE Macro Illuminator
- Macro scanning PL/PLE system
High-Resolution Low-Temperature PL of Semiconductors
Photoluminescence of Semiconductors
Quality assurance of Diamond films
Emission Spectroscopy in Supersonic Expansions
Raman and Resonance Raman Spectroscopy Enzymes