• Skip to navigation
  • Skip to content
  • Home
  • About HORIBA
  • Investor Relations
  • Corporate News
  • Publications
  • Social Responsibility
  • Careers
  • Contact Us
HORIBA
Country/Region Selection
France
Site search
  • Automotive Test Systems
  • Process & Environmental
  • Medical
  • Semiconductor
  • Scientific
  • All Segment Product Browser
  • Products
  • News & Events
  • About Us
  • Employment
  • Product Lines
  • Processes
  • Measuring Object
  • Measurement Method
    • Absorption spectroscopic method
    • Glass electrode method
    • Conductivity measurement and
      concentration conversion
    • Electromagnetic induction method
    • Fluoride ion electrode method
    • 2-electrode method
    • 4-electrode method
    • Laser scattering method
    • Molybdenum blue method and
      absorptiometric method
    • Blowing method
    • FTIR
    • CRDS
    • NDIR
    • Spectroscopic ellipsometry
    • Optical interferometric method
    • Plasma emission analysis method
    • Quadrupole mass spectrometry
    • Mass flow measurement
      Differential pressure detection method
    • Mass flow measurement
      Thermal sensor method
    • Soap film detection method
  • Product Name
Sommaire » Semiconductor » Products » Measurement Method » Blowing method

Blowing method

Blowing method
Reticle/Mask Particle Remover RP-1

Reticle/Mask Particle Remover RP-1

Automatically removes particles by blow and vacuum suctionAutomatically removes particles from the reticle/mask by air (or N2) blow and vacuum suction.  Removal of particles by routine use before lithography process extends...

© 1996-2012 HORIBA, Ltd. All rights reserved.
  • Terms & Conditions
  • Privacy Policy
  • Accessibility
  • Sitemap
  • Search