Semiconductor Page Heading

Defect / Impurity Monitoring

The photoluminescence method can evaluate the composition, defects, quantum wells, impurities, crystallinity of compound semiconductors in a non-destructive and non-contact manner. In silicon semiconductors, it is used for analyzing trace impurities in silicon.

We can meet a wide range of needs, from basic research to mapping measurements for quality inspections, with our customization capabilities unique to a spectrometer manufacturer.

 

LabRAM HR Evolution
LabRAM HR Evolution

Microscope Confocal Raman

LabRAM Soleil
LabRAM Soleil

Spectroscope Raman - Microscope d'imagerie automatisé

SMS
SMS

Add Spectroscopy to ANY Microscope

XGT-9000
XGT-9000

Microscope d'analyse X (Micro-XRF)

XGT-9000SL
XGT-9000SL

Microscope d'analyse X à très grande chambre

Request for Information

Do you have any questions or requests? Use this form to contact our specialists.

* These fields are mandatory.

Corporate