Ellipsometers
What´s New
Product News
Simple Thin Film Measurement with the New NIR Extended Spectral Range of Auto SE
HORIBA Scientific has extended the spectral range of the Auto SE in the Near Infra Red, with the instrument now covering the wavelength range from 440 to 1000 nm. The enhanced performance makes it ideal for automatic characterization of photovoltaic, semiconductor, flat panel display and optoelectronic thin film applications.
Launching the MM-16 NIR, New Spectroscopic Ellipsometer for Thin Film Applications in the Near Infra Red
The new MM-16 NIR spectroscopic ellipsometer is dedicated to thin film characterization, determining thicknesses, optical constants (n,k) and the optical bandgap of materials in the wavelength range 515-1000 nm.
NanoCharm European Project News
NanoCharM: an EU Project aimed at bringing Nanomaterials into mainstream markets, achieves two remarkable ‘firsts’.
NanoCharM, a Coordination and Support Action funded by the EU is notable for two ‘firsts’. Not only was it the first to be signed under the EU's Seventh Framework Programme, with a start date of January 1st 2008, but was also the highest ranked CSA project to be approved.
The project ‘kicked off’ at a meeting of the partners on the 8th February in the Italian CNR offices in Brussels.
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