Production processes are evolving rapidly which is reflected in a growing need for high-grade evaluation and analysis of a wide range of thin films and complex multilayer structures. HORIBA systems are capable of measuring film properties including stress, thickness and optical constants of complex and multilayer films and ultra-thin SiO2 films.
Masz pytania lub prośby? Skorzystaj z tego formularza, aby skontaktować się z naszymi specjalistami.
