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HORIBA Scientific Introduces New Clue Series Detectors For Scanning Electron Microscopes

HORIBA CLUE Series offer a scalable platform for imaging and spectroscopic analysis of nano-objects with SEM and dual SEM/FIB (Focused Ion Beam) microscopes.

HORIBA Scientific, global leader in spectroscopic analysis for over 40 years, is proud to announce the new HORIBA CLUE Series detectors for Scanning Electron Microscopes (SEM).

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Exhibitions

MMC - Microscience Microscopy Congress 2017

Event Dates: 3 July 2017 - 6 July 2017
Location: Manchester, UK
Website: http://mmc-series.org.uk

15éme colloque de la socité française des microscopies

Event dates: 4 July 2017 -7 July 2017
Location: Bordeaux , France
Website: http://sfmu-bordeaux2017.fr/

Semicon West 2017


Event dates: 11 July 2017 - 13 July 2017
Location: San Francisco, CA
Website: www.semiconwest.org

2017 Chinese National Conference on Surface Science and Technology and summer school

Event dates: 13 August 2017 - 15 August 2017
Location: Shantou, China
Website
: www.bmfx.org/page/html/company.php

JASIS

Event dates: 6 September 2017 - 8 September 2017
Location: Makuahri, Japan
Website: www.jasis.jp/en/information/2017.html

ICES 2017 International Conference on Enhanced Spectroscopies 2017

Event dates: 4 September 2017 - 7 September 2017
Location: München, Germany
Website: www.ices2017.cup.uni-muenchen.de/

E-MRS Fall Meeting

Event dates: 18 September 2017 -21 September 2017
Location: Warsaw, Poland
Website: www.european-mrs.com/meetings/2017-fall-meeting

ECASIA 2017 (17th European Conference on Applications of Surface and Interface Analysis)

Event dates: 24 September 2017 - 29 September 2017
Location: Montpellier, France
Website: www.ecasia2017.com/

POWTECH 2017

Event dates: 26 September 2017 - 28 September 2017
Location: Nuremberg, Germany
Website: www.powtech.de/en