Ellipsometry Application Notes
Spectroscopic ellipsometers are the perfect tools for measuring thin film thickness and optical constants (n and k) with high accuracy for single and multiple layer thin film structures. Thickness determinations range from a few angstroms to tens of microns. Characterization of advanced material properties are also possible such as: anisotropic structures, graded and non-uniform layers, alloy composition.
Spectroscopic ellipsometers are used for optoelectronic thin film structures analysis such as LED. Film thickness, optical constants and alloy composition are the properties of interest. HORIBA Scientific’s patented sample vision system provides the advantage to visualize and position the measurement spot inside a LED pixel. Read More