See us at

  • 9th Workshop Ellipsometry, Enschede, The Netherlands, 23-25 February
  • American Physical Society (APS), San Antonio, TX, Booth 335, March 2-6
  • Materials Research Society (MRS) Spring, San Francisco, CA, Booth 500, April 6-10
  • Society of Vacuum Coaters (SVC), Santa Clara, CA, April 28-29
  • 2015 EMRS Spring Meeting, May 11-15, Lille, France
  • Photovoltaics Specialists Conference (IEEE-PVSC), New Orleans, LA, Booth 402, June 14-19
  • American Vacuum Society (AVS), San Jose, CA Booth 429, Oct 18-23
  • Materials Research Society (MRS) Fall, Boston, MA, December 1-3

In-Situ / In-Line Ellipsometers

In-situ spectroscopic ellipsometers allow real-time monitoring and control of thin film deposition and etch processes with sub-monolayer resolution. It provides real-time calculation of film thickness, optical constants, and composition of thin film stacks in different ambient. The design of the ellipsometric heads facilitates the attachment to the process chamber or roll-to-roll system.

UVISEL In-Line Spectroscopic Ellipsometer

In-Line Spectroscopic Ellipsometer for Web Coater and Roll to Roll Systems

UVISEL In-Situ Spectroscopic Ellipsometer

In Situ Thin Film Process Control - Spectral Range from 190 to 2100 nm