In this article, we describe a combined Photoluminescence (PL) and PhotoReflectance (PR) system used to characterize High Electron Mobility Transistor (HEMT). Results include intersubband energies, Fermi-level location and 2D sheet density of the graded InxGa1-xAs channel.
The Optical Spectroscopy Division of HORIBA Jobin Yvon is proud to introduce the new Cathodoluminescence Universal Extension (CLUE) upgrade for Scanning Electron Microscopes (SEMs).
