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Raman-AFM and nano-Raman (TERS)

AFM-Raman, nano-Raman and TERS home

Physical and Chemical imaging on a single platform

One powerful tool for all your needs

HORIBA's leading Raman technology is now integrated with AIST-NT’s scanning probe microscopy (SPM). The NanoRamanTM platform integrates Atomic Force Microscopy (AFM) that can provide physical sample information on the nanometer scale, including topography, hardness, adhesion, friction, surface potential, electrical and thermal conductivity, temperature and piezo response (among many others), near-field optical techniques (SNOM or NSOM), Scanning Tunneling Microscopy (STM), tuning fork techniques (Shear-force and Normal-force imaging modes), electrochemistry, all together with the chemical information obtained from Raman spectroscopy. The end result is a more comprehensive sample characterization in one versatile instrument, for fast simultaneous co-localized measurements and Tip-Enhanced Raman Spectroscopy (TERS)..

Tip-Enhanced Raman (TERS): chemical imaging at the nanoscale

TERS brings you the best of both worlds: the chemical specificity of Raman spectroscopy with imaging at spatial resolution typically down to 10nm. This technique can be demonstrated on various samples ranging from 1D and 2D nanomaterials to DNA.

AFM-Raman and nano-Raman (TERS)
Tip-Enhanced Raman (TERS) image of a graphene oxide flake and several carbon nanotubes chemically resolved down to 15nm.

Not just TERS: high-speed TERS imaging!

HORIBA Scientific does not only provide TERS capable systems, nor do we only guaranty TERS enhancement when measuring at a single point. HORIBA Scientific is the first equipment manufacturer to guarantee TERS imaging capability and nano-resolution thanks to our STM-TERS tips, AFM-TERS tips and test samples.

Raman-AFM: High-speed, simultaneous SPM and spectroscopy

AFM-Raman topography AFM-Raman composite Raman image AFM-Raman single layer graphene AFM-Raman phase image AFM-Raman 2 layers graphene AFM-Raman capacitance AFM-Raman 3 layers graphene AFM-Raman Contact Potential Difference KPFM AFM-Raman defects in graphene AFM-Raman friction image AFM-Raman optical image
Co-localized AFM and Raman images of 1 layer, 2 layers and 3 layers graphene

  • AFM and other SPM techniques like STM, shear force or NSOM, provide topographic, mechanical, thermal, electrical, and magnetic properties with molecular resolution.
  • Confocal Raman spectroscopy and imaging provides specific chemical information about your nano-materials, with sub-micron spatial resolution.
  • A unique platform for simultaneous measurements helps you spend more time getting results with the confidence the images you get are truly correlated.
  • Combining high performance with ease of use, HORIBA offers a reliable and full-featured solution.

Unique features:

infrared AFM diode

Infrared AFM diode at 1300 nm: no optical interferences with the spectroscopy detection, for all SPM modes including all AFM modes.

Any typical laser can be used, from NUV to NIR, especially access to the red region for AFM required for TERS with gold probes.

Optical access

Optical access with high aperture objective lens (0.7NA) from both top and side: brings unequalled throughput and spatial resolution and optimized illumination conditions for TERS.

easy tip exchange

Simple tip exchange; fully automated alignment and tuning: no knobs to adjust to align the AFM laser.

High resonance-frequency scanner

High resonance-frequency scanner for high speed imaging and low sensitivity to acoustic vibrations. No need for active vibration isolation to obtain the true molecular resolution.

laser alignment visualization

Visual confirmation of alignment on all channels.

objective scanner

Short path-length and closed-loop objective scanner laser alignment: brings higher throughput and outstanding long term stability, critical for TERS imaging.

Configurations for Raman-AFM and TERS imaging

HORIBA offers Raman-AFM products all capable of TERS imaging, configured for all types of needs and budgets:

XploRA nano

XploRA Nano

Compact, fully automated and easy-to-use, the XploRA Nano concentrates the power of AFM-Raman into an affordable yet full-featured package, making TERS imaging a reality for all. The TERS proven system.

HR Evo Nano

HR Evo Nano

The HR Evo Nano brings ease-of-use and extreme flexibility together for the most demanding applications. With capabilities from deep UV to infrared, high spectral resolution, and an extended set of options and accessories, the HR Evo Nano is ideally suited to perform in any of your research challenge.

CombiScope XploRA

CombiScope XploRA

Designed with the life-science in mind, the CombiScope XploRA is the ideal combination of a research-grade biological microscope, compact XploRA confocal spectrometer and outstanding AFM for all those requiring inverted configuration.

TRIOS platform

TRIOS platform

The most versatile optical AFM coupling platform providing 3 ports for spectroscopy measurements with top-down, side and inverted access. Based on the CombiScope AFM design, the platform is compatible with both XploRA and LabRAM HR Evolution spectrometers.


Your XploRA and your LabRAM HR Evolution spectrometers can be upgraded into NanoRamanTM. The integration with the AFM can be made on site. Please contact us if you would like to know how this implementation can be done and understand how Raman-AFM and TERS could be applied to your research.

To learn more about this technology and how you can integrate all your needs into one powerful instrument, please contact us.