X-Ray Fluorescence Analysis
HORIBA’s XGT systems offer high performance energy dispersive X-ray fluorescence (EDXRF) analysis with unique capabilities.
The patented XGT (X-Ray Guide Tube) technology combines traditional X-ray fluorescence methodology with small spot analysis. High intensity X-ray beams with diameters ranging from 3 mm down to a unique 10 µm offer versatile analysis capabilities.
Full qualitative and quantitative elemental analysis is possible, even on individual microscopic particles, whilst mapping analysis provides detailed element distribution images.
Applications benefiting from HORIBA’s X-ray fluorescence technology include forensics, geology, materials, biology/medicine, electronics, archaeology, engine wear analysis, pharmaceutics, and RoHS/ELV compliance testing.
The unique XGT micro-XRF instruments provide unparalleled elemental analysis performance with spatial resolutions down to 10 µm. These systems provide a complete elemental analysis solution, including qualitative and quantitative characterisation via single point analysis, automated multi-point analysis and fast XRF imaging. Unique dual vacuum modes allow "high sensitivity" and "atmospheric pressure" analysis of all elements from sodium to uranium.
RoHS and ELV Analysis
XRF analysis is widely used for fast, non-destructive screening of manufacturing materials and parts for RoHS and ELV compliancy. The XGT systems offer high sensitivity analysis for the five restricted elements (lead, cadmium, mercury, chromium, bromine) with limits of detection below 5 ppm. The standard 1.2 mm analysis beam allows individual cables and components to be accurately analysed, without risk of false pass/fail results.