Simple Thin Film Measurement with the New NIR Extended Spectral Range of Auto SE

HORIBA Scientific has extended the spectral range of the Auto SE in the Near Infra Red, with the instrument now covering the wavelength range from 440 to 1000 nm. The enhanced performance makes it ideal for automatic characterization of photovoltaic, semiconductor, flat panel display and optoelectronic thin film applications.

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The NanoCharM - Multifunctional Nanomaterials Characterisation exploiting ellipsometry and polarimetry project was carried out by 8 European partners between January 2008 and December 2010 with the goal to raising the profile of ellipsometry and polarimetry as key characterization tools, while improving their capability in nanoscience and nanotechnology.

The challenge of the NanoCharM program has been to advance the state-of-the-art of optical techniques for application to nanometrology problems and to create new strategies, measurement and analysis procedures in ellipsometry that go beyond those currently available.

More information on NanoCharM European Project Achievements

Visit the NanoCharM website