Spectroscopic Ellipsometer Options

A complete range of accessories are available for the UVISEL and the MM-16 Spectroscopic Ellipsometers to enhance and expand instrument performance and versatility. The modular design of the UVISEL and MM-16 allows the instrument to be easily upgraded during its lifetime to best suit changing application requirements.

XY motorized stage OpenMap thin film uniformity

Rotation or q stage Open

Study anisotropic samples

Automatic goniometer Open

Vary angle of incidence useful for sample mesurement at brewster angle and in transmission/reflection

Reflectometry Module Open

Measure spectroscopic reflectance of sample at normal incidence

Temperature controlled stage Open

Study how film properties change with temperature, useful for thermal transition analysis of polymers, band structure of compound alloys

Electrochemical cell Open

Study electrochemical processes

Liquid cell Open

For solid and solid/liquid experiments

Sealed cell Open

For the characterization of thin films under non-air ambient...

Cryostat Open

Maintain cold cryogenic temperature useful for the study of magnetic materials

Compact integrated goniometer Open

Cost-effective benchtop metrology tool