Veranstaltung
Beginn: 09/17/26
Ort: Online
Two sessions are available for this webinar:
- 9 AM BST / 10 AM CEST / 4 PM CST / 5 PM JST
- 4 PM BST / 5 PM CEST / 8 AM PDT / 11 AM EDT
Combining Atomic Force Microscopy (AFM) with Raman spectroscopy opens new possibilities for comprehensive sample characterization by bringing together complementary physical and chemical information in a single experiment.
This educational webinar introduces the fundamentals of both techniques before demonstrating the benefits of their integration. In the first part, you will discover how AFM uses a nanometer-scale probe to reveal surface topography and map a wide range of physical properties, including mechanic strength, electrostatic charges and magnetic fields. You will also learn how Raman spectroscopy provides detailed, non-destructive chemical and molecular information through vibrational analysis.
The second part of the webinar will show how these complementary techniques can be easily combined into a single correlated workflow. Through practical application examples acquired with the HORIBA SignatureSPM AFM-Raman platform, you will see how correlated microscopy enhances data quality, simplifies interpretation, and enables a deeper understanding of complex materials.
Whether you are an AFM user looking to explore Raman spectroscopy, a Raman specialist interested in AFM, or a researcher seeking advanced multimodal characterization techniques, this webinar will provide a practical introduction to the power of correlated microscopy.
During this webinar, you will learn how to:
- Understand the fundamentals of AFM and Raman spectroscopy.
- Explore the complementary information provided by each technique.
- Discover the advantages of correlated AFM-Raman microscopy.
- See real-world application examples across a variety of materials.
- Learn how the HORIBA SignatureSPM enables multimodal nanoscale characterization.
