
Industry
Natural Resources & Infrastructure
Displaying results 21 to 30 out of 33
- < Previous
- Page 1
- Page 2
- Page 3
- Page 4
- Next >
A revolutionary advance in Fluorescence offering an increase in the rate of data-collection by 10,000 times and dynamic range by 1000 times over conventional approaches.
Optimized for near-IR emissions of nanotubes and quantum dots, our Nanolog® offers the ultimate in research-grade spectroscopic measurements and accessories, and takes full excitation-emission matrix scans in seconds. Included is our unique software for classifying SWNTs and performing energy-transfer calculations.
Over the past several decades, HORIBA has designed and manufactured a complete line of high-quality non-dispersing infrared analyzers and analyzer systems. HORIBA has extended infrared gas analyzer technology to the continuous...
This field-type dissolved oxygen meter measures dissolved oxygen concentration (DO), oxygen concentration (O2), saturation (SAT.RATIO) and temperature of water solutions. It uses a laboratory sensor to enable BOD measurement....
The SLFA-2100/2800 are designed specifically to meet the recent demanding needs of measuring the new low sulfur fuels, diesel and RFG.
SEM and Optical Microscopes are important instruments for the research, development and Q/C of materials. Up to now, the preparation needed to get a true sample surface requires high-level technical know-how and many hours.
By using TENSEC, anyone can prepare a surface in just 10 seconds (the World’s first).
HORIBA designs, assembles, calibrates and tests complete integrated systems for simultaneously measuring multiple pollutants. A system for monitoring five pollutants can typically fit into one 19-inch rack. Rack-mounted systems...
The TX-100 Tunable Laser Gas Analyzer simultaneously measures the hydrogen chloride and H2O of the stack gas. Since the single probe method is applied in the optical system of the analyzer, TX-100 can be mounted from...
In-Line Spectroscopic Ellipsometer for Web Coater and Roll to Roll Systems
Products: UVISEL Plus: 190-920 nm | NIR Option: 2100 nm
Measure thin film thickness and optical constants. The reference ellipsometer for research and process development.
- < Previous
- Page 1
- Page 2
- Page 3
- Page 4
- Next >









