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Products: UVISEL Plus: 190-920 nm | NIR Option: 2100 nm
Measure thin film thickness and optical constants. The reference ellipsometer for research and process development.
Multi-Component Gas Analyzer VA-5000 Series is an all-round analyzer that fits today’s measurement needs ...
XelPleX is the ideal solution for label-free and multiplexed molecular interaction analysis.
Single point analysis and automated hyperspectral imaging.
Dual vacuum modes.
Spot sizes from 1.2 mm to 10 µm.
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