Cathodoluminescence - CLUE Series

Cathodoluminescence Solutions for Electron Microscopy

HORIBA's Cathodoluminescence Universal Extension enhances any SEM’s analytical capabilities while maintaining its original functionality. Since the sample is able to remain in the same spot, CLUE can easily be combined with other microscopy applications, such as EDS and EBIC.

Get more information on the Cathodoluminescence product line.

Segment: Scientific
Manufacturing Company: HORIBA France SAS

CLUE systems include HORIBA's MicroHR, iHR and LabRAM series spectrometers, Synapse Plus™ and Syncerity™ CCDs and EMCCDs, Symphony™ InGaAs arrays as well as photomultiplier tube detectors to create an unrivalled flexibility.
CLUE is also fully automated, controlled by LabSpec 6 Spectroscopy Suite Software, with experimental parameters, data-fitting, display and export. It is easy to use and offers comprehensive system control, and advanced data acquisition routines.

 

Co-localized microscopy techniques for pyrite mineral spatial characterization
Co-localized microscopy techniques for pyrite mineral spatial characterization
In this study we have chosen to investigate pyrite and its surrounding minerals in order to identify the different mineral phases as well as the chemical variations from micro- to nano-scale. Using the different microscopes instruments and being co-localized allows a comprehensive characterization of the sample and a precise superimposition of all the images.
Defect Evaluation of GaN Epitaxial Wafer by CL
Defect Evaluation of GaN Epitaxial Wafer by CL
The threading dislocation occurs easily in GaN crystal grown on sapphire substrates. It is said that this is caused by the large lattice mismatch of sapphire and GaN. The crystal may seem to be uniform in the SEM image, but the dark spot such as the threading dislocation can be observed when measuring the CL intensity image at the wavelength (362nm) which corresponds to the band edge emission.
Luminescent Defects in Synthetic CVD Diamond Films Localized by Cathodoluminescence Spectroscopy
Luminescent Defects in Synthetic CVD Diamond Films Localized by Cathodoluminescence Spectroscopy
The characterization of synthetic CVD diamond material by hyperspectral cathodoluminescence spectroscopy and imaging allows the detection and accurate location of the promising NV luminescent point defects for innovative solid-state quantum mechanical systems. In this work we performed CVD epitaxial growth on a pattern of micro-pillars etched on a diamond substrate. Cathodoluminescence (CL) analysis revealed that NV centres were successfully localized at the edges of the pillars.
The Evaluation of Phosphor for White LEDs by CL Image
The Evaluation of Phosphor for White LEDs by CL Image
Phosphor plays a key role to obtain white light as for blue LED + phosphor and near ultraviolet LED + phosphors. In order to improve high bright white LEDs, it is necessary that the whole phosphor particle emits light homogeneously. When measuring with CL the phosphor used as white LED, the area which does not emit light in phosphor particle can be observed. CL system is used for evaluation of non-luminescent area to improve luminescent efficiency and characteristics.

Product Variants

F-CLUE
F-CLUE

Compact Hyperspectral Cathodoluminescence

H-CLUE
H-CLUE

Versatile Hyperspectral Cathodoluminescence

R-CLUE
R-CLUE

Raman Photoluminescence & Cathodoluminescence

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Product accessories

Labspec 6
Labspec 6

Spectroscopy and imaging software

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