Surface and Interface studies require the use of multiple analytical techniques as each instrumentation provides partial results only, based on the interaction of the investigated material with a probing medium. The recently published Compendium of Surface & Interface Analysis features 134 chapters, each one dedicated to an individual technique[1].
Elemental Analysis plays a key role there, first to assess the chemical composition of the investigated materials, but also to understand the migration of elements with depth in corrosive environments. It can also detect local inhomogeneities that could induce fragility to evaluate on line surfaces reactivity or optimize and control deposition methods (such as electroplating, PVD, ALD etc).
HORIBA offers multiple elemental techniques with ICP (AESEC), GDOES, Combustion Analyzers (for C/S and O/N/H), µ XRF and in-line XRF but also other techniques like Raman or Ellipsometry that are extremely valuable for surface and interface analysis of thin and thick films.
Coupling of techniques (as for instances GD and Raman) is also an asset opening a multidimensional view on the investigated materials at micro and macro scales.
Glow Discharge Optical Emission Spectroscopy (GDOES) enables depth-resolved analysis of solid materials, measuring elemental concentrations as a function of depth. The GDOES instruments are used in universities where they contribute to the development of new materials with coatings at nanoscale and upward and in industries to monitor photovoltaic devices manufacturing, to understand the origin of corrosion, to assess the composition of precious metals, to control hard disks or LED manufacturing, to improve Li batteries, etc.
Learn more about HORIBA GDOES products and technology
Presented by Patrick CHAPON, this webinar will showcase the powerful combination of GDOES and Raman spectroscopy for simultaneous elemental and molecular depth profiling. GDOES delivers ultra-fast, nanometer-scale elemental analysis, while Raman adds molecular insight, which is ideal for complex multilayers like polymer‑metal stacks. Participants will discover how this dual approach meets analytical challenges across materials science and surface/interface research.
Watch the replayby Suyeon LEE
Depth profiling of organic coatings is challenging due to slow, uneven erosion of carbon-based materials. HORIBA France SAS developed and patented a GDOES method adding oxygen to the argon plasma, boosting sputtering efficiency and uniformity. Applied to Renault’s multilayer samples, it enables accurate, reproducible analysis of stacks combining organic and inorganic layers. This approach benefits automotive, aerospace, electronics, and photovoltaic industries where precise layer characterization is critical.
Read the application noteby Suyeon LEE
This work combines GDOES with an Ar/O₂ mix, Raman spectroscopy, and µXRF to characterize complex organic/inorganic multilayer coatings. The Ar/O₂ mixture ensures uniform sputtering, while Raman and µXRF enable non-destructive analysis inside the crater. Identical Raman and XRF results confirm no chemical alteration, validating layer integrity. This approach provides precise depth profiling and reliable material evaluation, ideal for advanced applications such as automotive coatings, R&D, and quality control.
Read the application noteGD-OES offers you a way to characterize the surface of under-layers by analyzing GD-OES craters using Raman and µ-XRF, confirming no alteration of the surface in complex organic/inorganic coatings.
Senior Researcher in Materials Science University of Sevilla, Spain
I have been a GD-OES user for more than 10 years. During that time, I made use of the exceptional capabilities of the equipment to obtain detailed compositional depth profiles on ultrathin (few nanometers) and thick (several hundreds of microns) coatings. A myriad of samples were tested including metallic layers, oxides, nitrides, hydrides and multilayer stacks of them. Moreover, I was deeply involved in the development of light element calibration (i.e nitrides) and deconvolution algorithms to improve the surface resolution of the system. As a result of such studies, we wrote in 2010 a comparative study of RBS, SIMS, XPS and GDOES in multilayer depth profiling (doi: 10.1007/s00216-009-3339-y).
After a break of almost 10 years in my GD activities, I have resumed them in 2025 and I am looking forward to trying the new advances of the technique (Differential Interferometry Profiling (DiP), smaller anodes…) 
The application of Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES) in the advanced characterization of batteries, recycled materials, critical raw materials, and support in the nuclear field offers unparalleled analytical capabilities. This webinar explores the multifaceted benefits and applications of HORIBA's ICP-OES, highlighting its role in the sectors of batteries, recycled materials, critical raw materials, and nuclear field support.
Watch the replayFor corrosion purposes, to predict failures, optimize material lifespan, and develop effective corrosion protection strategies, ensuring durability and reliability in demanding environments, different advanced analytical solutions are needed. We will present a comprehensive range of advanced analytical solutions for the corrosion market, designed to address the complexities of corrosion processes and protection strategies.
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