Search
English
Corporate
Products
Raman Imaging and Spectrometers
Raman Solution by Activity
Raman Solution by Hardware Feature
Raman Application Corner
Raman Academy
Browse Products
LabRAM Soleil
XploRA PLUS
LabSpec 6 Spectroscopy Suite Software
AFM Optical Platform
Browse Products
SignatureSPM
OmegaScope
SmartSPM
TRIOS
XploRA Nano
LabRAM Nano
LabRAM Soleil Nano
CombiScope
Fluorescence Spectrometers
Steady State Fluorescence
Fluorescence Lifetimes with TCSPC
Fluorescence Microscopy
Browse Products
Aqualog
DeltaFlex TCSPC
DeltaPro TCSPC
Duetta
FLIMera
Fluorolog-QM
FluoroMax
InverTau
Nanolog
Veloci
X-ray Fluorescence Analyzers [XRF]
Micro-XRF Application Corner
XGT-9000 | X-ray Analytical Microscope
MESA-50 | X-Ray Fluorescence Analyzer
MESA-50K | X-Ray Fluorescence Analyzer
Glow Discharge Optical Emission Spectrometry (GDOES)
GD-Profiler 2
ICP-OES Spectrometers
Ultima Expert
Ultima Expert LT
Carbon, Sulfur, Oxygen, Nitrogen and Hydrogen Analyzers
Application corner
EMIA-Expert | C/S Analyzer
EMIA-Pro | C/S Analyzer
EMIA-Step | C/S Analyzer
EMGA-Expert (EMGA-30E/20E) | O/N/H Analyzer
EMGA-Expert (EMGA-21E) | H Analyzer
EMGA-Pro (EMGA-20P) | O/N/H Analyzer
Sulfur-in-Oil
Sulfur-in-Oil Home
Energy Dispersive X-ray Fluorescence
Combustion Elemental Analysis
Browse All Products
SLFA-60
SLFA-6000
MESA-7220V2
MESA-7220
Particle Characterization
Particle Size
Zeta Potential
Particle Concentration
Browse All Products
Partica LA-960V2
Partica mini LA-350
ViewSizer 3000
nanoPartica SZ-100V2 Series
Custom Spectroscopy Solutions
Modular Raman
Photoluminescence
Time Resolved Fluorescence
Cathodoluminescence
Spectrometers and Monochromators
Scientific Cameras and Single Channel Detectors
Mini-Spectrometers and Scientific Cameras for OEMs
Grating Spectrometers
OEM Deep-Cooled Scientific Cameras
Diffraction Gratings for Industrial OEM and Scientific Research
Gratings for Industrial OEM
Gratings for Scientific Research
Surface Plasmon Resonance imaging (SPRi)
OpenPleX
SPRi-Arrayer
Spectroscopic Ellipsometry
UVISEL Plus
Auto SE
Smart SE
Forensics
Applications
Automotive & Aeronautics
Semiconductors
Material Sciences
Biotechnology and Biomedical
Biopharma and Pharma
Cosmetics
Food & Beverage
Environment
Energy
Chemistry
Metallurgy
Others
Technologies
Spectroscopy
Cathodoluminescence
Raman Spectroscopy
AFM-Raman
Fluorescence Spectroscopy
Photoluminescence Spectroscopy
Diffraction Gratings
Monochromator and Spectrograph
Detectors
X-ray Fluorescence Spectroscopy (XRF)
Spectroscopic Ellipsometry
Microscopy and Imaging
Raman Microscopy
Cathodoluminescence
Atomic Force Microscopy [AFM]
AFM-Raman
Nanoparticle Tracking Analysis
Particle Analysis
Dynamic Light Scattering
Static Light Scattering
Molecular Weight
Zeta Potential
Image Analysis of Particles
Nanoparticle Tracking Analysis
Centrifugal Sedimentation
Elemental Analysis
Glow Discharge Optical Emission Spectroscopy (GDOES)
Inductively Coupled Plasma - Optical Emission Spectroscopy (ICP-OES)
Carbon/Sulfur & Oxygen/Nitrogen/Hydrogen Analysis
X-ray Fluorescence Spectroscopy (XRF)
Surface Plasmon Resonance
Surface Plasmon Resonance imaging
Resources
eBooks
Webinars
Videos On Demand
Science in Action Series
Women in Science Series
Spectroscopy Matters
Nobel Laureate Connections
Jobin Yvon History - 200 Years of Optical Innovation
Events
In the Media
Career
Support
Worldwide Locations
Contact
Country / Region
Change
Contact us
Find us
HORIBA
»
Scientific
» Resources
Oops, an error occurred! Code: 202602061622220aa87807
Contact us
Corporate