Surface Analysis of Corrosion/Contamination for Material Science

Elemental distribution is crucial for material science. The XGT-9000 Series provides this information non-destructively. Unlike SEM-EDS, it can analyze non-conductive samples without carbon or metal coating treatment. With the light elements detector, it is used for instances in corrosion studies.

Sample: Fe plate partially corroded

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X-ray Analytical Microscope (Micro-XRF)