Raman/PL deployment as a characterization/metrology tool for semiconductors

|   Event

You are invited to register for our new webinar: Thursday, December 11th, at 9 AM (GMT); 10 AM (CET), or at 4 PM (GMT); 5 PM (CET)

Veranstaltung

Beginn: 12/11/25

Ort: Online

Two sessions are available for this webinar:

  • 9 AM GMT / 10 AM CET / 5 PM CST / 6 PM JST
  • 4 PM GMT / 5 PM CET / 8 AM PST / 11 AM EST
     

Raman microscopy has become an essential tool for semiconductor research and manufacturing, offering non-destructive, highly precise insights into material properties. From strain analysis to defect detection and full wafer mapping, Raman and photoluminescence microscopies help engineers tackle the complexity introduced by new semiconducting compounds such as wide band gap and two-dimensional materials. In this webinar, we’ll show how Raman analysis supports process optimization and qualification, quality control and process deviation diagnostics.

Join us to learn practical strategies and see real-world examples of Raman & photoluminescence in action.

Key topics will include:

  • Learn about the wealth of information that can be provided by Raman analysis
  • Learn about the critical instrumental parameters and features needed for useful semiconductor Raman/PL measurements
  • Understand the capital-gain of Raman microscopy for semiconductor industry
     

​​​Who should attend:

  • Research scientists working on semiconductor materials development,
  • Characterization managers in core facilities
  • Metrology managers, failure analysis engineers
  • Raman/PL microscopists