Battery

The battery market has grown dramatically since the first commercial introduction of automotive applications in the early 90’s, as well as increased demands for other electronic devices. Difficult issues, such as increasing capacity needs, safety, and longevity as well as the demands for weight reduction and charge times all need to be addressed.  Every stage of the manufacturing process needs to be understood and controlled in order to maintain competitiveness and profitability. From any single component (cathode, anode, separator and electrolyte) to full pack, the scientific fields and technologies involved require fast and innovative characterization tools.

Advanced materials research considers study of new material as well as their exploration at material level. Applied research will conciliate needs of industrialization through optimization of cell chemistry, establishment of advanced processing technologies and life time improvement. Advanced batteries development finalizes the performance optimization and cost reduction. Batteries production requires fast, easy and accurate QC monitoring, which provides fast detection of defaults in safety and performances issues, along with fast decision making when default is suspected. This will save time and money, while providing perfect traceability.

Causes of Deterioration

HORIBA Scientific Analyzers

  • Crystallinity and crystal structural change based on Li-ion insertion and removal
Raman Spectroscopy
  • Reactivity influence by particle size
Particle Distribution Analyzer
  • Oxygen generation in high-temperature environment
Oxygen Analyzer
  • Elution of manganese ions
ICP-OES
  • Li Stoichiometry anomaly, deficient oxygen, degradation with charge/discharge cycle, surface oxidation, corrosion evaluation
GD-OES
  • Foreign material incorporation, moisture absorption, oxidation into active materials

X-ray Fluorescence Analyzer

  • Uneven distribution and gaps in active material
X-ray Fluorescence Analyzer

Causes of Deterioration

HORIBA Scientific Analyzers

  • Crystallinity evaluation of carbons by insert and desorption Lithium-ion
Raman Spectroscopy
  • O reactivity influence by particle size
Particle Distribution Analyzer
  • Hyporeactivity by formulation of Separator Electrolyte Interface (SEI)
GD-OES
  • Foreign material incorporation, moisture absorption, oxidation into active materials

X-ray Fluorescence Analyzer

  • Uneven distribution and gaps in active material
X-ray Fluorescence Analyzer

Causes of Deterioration

HORIBA Scientific Analyzers

  • Abnormal value of pH
pH, Particle Distribution Analyzer
  • Uneven size of active materials in the process of slurry in anode
Particle Distribution Analyzer
  • C identification type
Raman Microscopy

Causes of Deterioration

HORIBA Scientific Analyzers

  • Separator damage by metallic foreign materials (dusting, burr)

X-ray Fluorescence Analyzer

  • O reactivity with C based material, porosity of membrane 
Oxygen Analyzer

Causes of Deterioration

HORIBA Scientific Analyzers

  • Monitor the reaction of LiPON with air, homogeneity of the coating thickness 
Spectroscopic Ellipsometry

Browse Applications

Related Products

EMGA-Expert
EMGA-Expert

Oxygen/Nitrogen/Hydrogen Analyzer
(Flagship High-Accuracy Model)

EMGA-Pro
EMGA-Pro

Oxygen/Nitrogen Analyzer (Entry Model)

Partica CENTRIFUGE
Partica CENTRIFUGE

Centrifugal Nanoparticle Analyzer

XGT-9000
XGT-9000

X-ray Analytical Microscope (Micro-XRF)

GD-Profiler 2™
GD-Profiler 2™

Discover a Whole New World of Information with Glow Discharge Optical Emission Spectrometer

EMGA-920
EMGA-920

Oxygen/Nitrogen Analyzer

LabRAM Soleil
LabRAM Soleil

Multimodal Confocal Raman Microscope

LabRAM HR Evolution
LabRAM HR Evolution

Confocal Raman Microscope

EMGA-930
EMGA-930

Oxygen/Nitrogen/Hydrogen Analyzer

LabRAM Odyssey
LabRAM Odyssey

Confocal Raman Imaging & High Resolution Spectrometer

EMGA-921
EMGA-921

Hydrogen Analyzer

Smart SE
Smart SE

Powerful and Cost Effective Spectroscopic Ellipsometer

EMIA-Step
EMIA-Step

Carbon/Sulfur Analyzer (Tubular Electric Resistance Heating Furnace Model)

PG-300 series
PG-300 series

Portable Gas Analyzer

Auto SE
Auto SE

Spectroscopic Ellipsometer for Simple Thin Film Measurement

VA-5000 / VA-5000WM Series
VA-5000 / VA-5000WM Series

Multi-Component Gas Analyzer

UVISEL Plus
UVISEL Plus

Spectroscopic Ellipsometer from FUV to NIR: 190 to 2100 nm

EMIA-Expert
EMIA-Expert

Carbon/Sulfur Analyzer
(Flagship High-Accuracy Model)

EMIA-Pro
EMIA-Pro

Carbon/Sulfur Analyzer (Entry Model)

Partica LA-960V2
Partica LA-960V2

Laser Scattering Particle Size Distribution Analyzer

XGT-7200
XGT-7200

X-ray Analytical Microscope

Informationsanfrage

Sie haben Fragen oder Wünsche? Nutzen Sie dieses Formular, um mit unseren Spezialisten in Kontakt zu treten.

* Diese Felder sind Pflichtfelder.