From blank wafer to final device, HORIBA’s analytical instrument for material characterization are used by leading end-user and research organization for more than 50 years. Designed to achieve ultimate performances, they are the right tools to accelerate the time to market and yield improvement in any processes involving thin film and advanced material deposition.
In-situ spectroscopic ellipsometer for real-time thin film monitoring
In-Line Spectroscopic Ellipsometer for Web Coater and Roll to Roll Systems
Spectroscopic Ellipsometer for Simple Thin Film Measurement
Modular Research Fluorometer for Lifetime and Steady State Measurements
Fluorescence and Absorbance Spectrometer
Confocal Raman Microscope
Cathodoluminescence Solutions for Electron Microscopy
Mid-Focal Length Imaging Spectrometers
Confocal Raman Microscope
Multimodal Confocal Raman Microscope
Add Spectroscopy to ANY Microscope
Discover a Whole New World of Information with Glow Discharge Optical Emission Spectrometer
Ultra-Fast, Sensitive and High Resolution Depth Profiling technique
Oxygen/Nitrogen Analyzer
Complete your ICP-OES Spectrometer for your specific needs
X-ray Analytical Microscope (Micro-XRF)
X-ray Analytical Microscope
with a Super Large Chamber
TCSPC Lifetime Fluorometer
AFM-Raman for Physical and Chemical imaging
AFM-Raman for physical and chemical imaging
Simultaneous Multi-Laser Nanoparticle Tracking Analysis (NTA)
Centrifugal Nanoparticle Analyzer
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