
Optische Spektroskopie
Application Notes for Optical Spectroscopy
- Characterization of Semiconductors with Photoluminescence Measurement system
- Combined Spectroscopic Analyses of Semiconductor Material Structures at the Microscopic Level
- Raman and PL Characterization of GaN
- Pulsed Plasma Monitoring
- PL/PLE Macro Illuminator
- Macro scanning PL/PLE system
The Role of Detectors in Spectroscopy
Ground-Based Measurements of Stratospheric Gases Using UV-VIS Spectroscopy
Combustion Analysis with HORIBA M-Series Spectrometers and Synapse CCD
Lifetime Measeurements in PV Material Characterization
MicroHR: Absorption/Transmission Experiments
Photoluminescence and Photoreflectance
EFiS: Quality-Control Of Solar Cells
AToR: HDR Imaging And Fast, Even Tracking For Astronomy
Etalon Fringe Suppression with the Qextra BIDD Camera
Luminescence of Rare Earth Doped Glasses
Bringing multi-channel data-acquisition to LabVIEW™
Evaluation of Novel Photoresponsive Materials via EQE Measurements
Experimental Assessment of Metal Nanostructures as Effective SERS Substrates
Fluorescence Hyperspectral Imaging: Counterfeit Currency Detection and Analysis
High-Resolution Low-Temperature PL of Semiconductors
Photoluminescence of Semiconductors
Quality assurance of Diamond films
Emission Spectroscopy in Supersonic Expansions
Raman and Resonance Raman Spectroscopy Enzymes
News
HORIBA Scientific Launches Innovative And Cost Effective Microscope Optical Spectrometer...Read more