Optische Spektroskopie
Application Notes for Optical Spectroscopy
- Characterization of Semiconductors with Photoluminescence Measurement system
- Combined Spectroscopic Analyses of Semiconductor Material Structures at the Microscopic Level
- Raman and PL Characterization of GaN
- Pulsed Plasma Monitoring
- PL/PLE Macro Illuminator
- Macro scanning PL/PLE system
The Role of Detectors in Spectroscopy
Ground-Based Measurements of Stratospheric Gases Using UV-VIS Spectroscopy
Combustion Analysis with HORIBA M-Series Spectrometers and Synapse CCD
Lifetime Measeurements in PV Material Characterization
MicroHR: Absorption/Transmission Experiments
Photoluminescence and Photoreflectance
EFiS: Quality-Control Of Solar Cells
AToR: HDR Imaging And Fast, Even Tracking For Astronomy
Etalon Fringe Suppression with the Qextra BIDD Camera
Luminescence of Rare Earth Doped Glasses
Bringing multi-channel data-acquisition to LabVIEW™
Evaluation of Novel Photoresponsive Materials via EQE Measurements
Experimental Assessment of Metal Nanostructures as Effective SERS Substrates
Fluorescence Hyperspectral Imaging: Counterfeit Currency Detection and Analysis
High-Resolution Low-Temperature PL of Semiconductors
Photoluminescence of Semiconductors
Quality assurance of Diamond films
Emission Spectroscopy in Supersonic Expansions
Raman and Resonance Raman Spectroscopy Enzymes
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HORIBA Scientific Launches Innovative And Cost Effective Microscope Optical Spectrometer...Read more
