Scientific

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Scientific

Surface Characterization

Surface characterization instruments measure physical, mechanical and chemical parameters of an interface such as thin films and coatings. These instruments are used to measure optical properties, film thickness, composition, morphology and other parameters related to surface analysis.

HORIBA provides a wide range of surface characterization instruments including:

 

These instruments are used over a broad range of market such as:

  • Material Sciences for nanomaterials, graphene, quantum dots
  • Semiconductor for display technology, light emitting diodes, data storage
  • Energy for battery, photovoltaics cells

Spectroscopic Ellipsometers

Glow Discharge Optical Emission Spectrometers

Plasma Profiling Time-Of-Flight Mass Spectrometers

 

 

Atomic Force Microscopes

Raman Spectrometers

Browse Products

Auto SE
mehr Auto SE

Spectroscopic Ellipsometer for Simple Thin Film Measurement

CombiScope
mehr CombiScope

AFM and inverted light microscopy

GD-Profiler 2™
mehr GD-Profiler 2™

Discover a Whole New World of Information with Glow Discharge Optical Emission Spectrometer

HE Spectrograph
mehr HE Spectrograph

High efficiency dedicated process Raman spectrometer for rugged and robust Raman monitoring.

LabRAM HR Evolution
mehr LabRAM HR Evolution

Confocal Raman Microscope

LabRAM Nano
mehr LabRAM Nano

AFM-Raman for physical and chemical imaging

LabRAM Odyssey
mehr LabRAM Odyssey

Best-in-class Raman Imaging & High Resolution Spectrometer

LabRAM Soleil
mehr LabRAM Soleil

Raman Microscope

LabRAM Soleil Nano
mehr LabRAM Soleil Nano

Real-time and Direct Correlative Nanoscopy

MacroRAM™
mehr MacroRAM™

Affordable Benchtop Raman Spectrometer

OmegaScope
mehr OmegaScope

The AFM optical platform

Plasma Profiling TOFMS
mehr Plasma Profiling TOFMS

Ultra-Fast, Sensitive and High Resolution Depth Profiling technique

ProteusQ
mehr ProteusQ

Scanning NV Magnetometry

Raman Fiber Probes
mehr Raman Fiber Probes

Raman Spectrometers

Smart SE
mehr Smart SE

Powerful and Cost Effective Spectroscopic Ellipsometer

SmartSPM
mehr SmartSPM

Advanced stand-alone AFM

Spectroscopic Ellipsometer - In-Line
mehr Spectroscopic Ellipsometer - In-Line

In-Line Spectroscopic Ellipsometer for Web Coater and Roll to Roll Systems

TRIOS
mehr TRIOS

Versatile AFM Optical Coupling

UV Raman Spectrometer
mehr UV Raman Spectrometer

for UV Raman spectroscopists

UVISEL 2 VUV
mehr UVISEL 2 VUV

A versatile spectroscopic ellipsometer covering a large range from VUV to NIR

UVISEL Plus
mehr UVISEL Plus

Spectroscopic Ellipsometer from FUV to NIR: 190 to 2100 nm

UVISEL Plus In-Situ
mehr UVISEL Plus In-Situ

In-situ spectroscopic ellipsometer for real-time thin film monitoring

XploRA INV
mehr XploRA INV

Inverted Raman Microscope

XploRA Nano
mehr XploRA Nano

AFM-Raman for Physical and Chemical imaging

XploRA™ PLUS
mehr XploRA™ PLUS

Raman Spectrometer - Confocal Raman Microscope