PD Xpadion

光罩顆粒檢測系統

滿足未來需求的新一代檢測平台

PD-Xpadion 是 HORIBA 顆粒檢測產品的最新一代。基於創新的模組化平台設計,PD Xpadion 是滿足生產過程中光罩和薄膜檢查當前和未來需求的最佳工具。將晶圓廠自動化與 HORIBA 核心技術相結合,不僅包括顆粒檢查和檢測,還包括透過拉曼分析進行顆粒表徵、薄膜厚度和均勻性以及薄膜健康監測工具。

事業部: Semiconductor
產品分類: Metrology
製造商: HORIBA, Ltd.

請選擇一個本產品可販售的國家或區域:
China,Germany,Ireland,Israel,Italy,Korea (South),Malaysia,Singapore,Taiwan,United Kingdom,United States
瀏覽完整列表 點擊此處.

  • Adjustable detection sensitivity by utilizing a combination of optical systems
  • OHT, EFEM, multi-port, multi-slot adaptation
  • Ability to reanalyse inspection data for faster inspection recipe optimization
  • Integration options with other HORIBA sensor products like Raman spectroscopy and Ellipsometry
  • False detection reduction function
  • Innovative software with improved usability
Model   PD Xpadion
Dimensions (W) x (D) x (H) 1,000 x 1,850 x 1,600 mm
Weight Approx. 950kg
Inspection Particle Size Pattern 0.5 μm / 0.35 μm (0.1 μm : Blank Mask)*¹
Glass 5.0 μm (0.5 μm - : High Sensitivity Option)*¹
Pellicle 10.0 μm (0.5 μm - : High Sensitivity Option)*¹
Light Source 633 nm He-Ne laser or 488 nm Solid-state laser
Reticle Size 5 inch - 9 inch
Case openers SMIF POD, Compatible with various cases
Throughput Approx. 12 min (From inspection start to test result display for 2 surface (6 inch) inspection)
Panel Surface Treatment Stainless Steel
Installation Environment Cleanliness Class6 ISO standards or better 
Temperature 23 +/- 1°C
Utilities Power AC200-240 V, 2 kVA 50/60Hz, Single Phase
Vacuum Source Pressure -80 kPA or less
Compressed Air 0.6 MPa - 0.7 MPa

New Function / Option

Reticle Edge Handling Yes
Auto Capture / Auto Sizing Yes
Data Browser Function Yes
False Detection Reduction Function Yes

*PSL equivalent , HORIBA recommends customer sample test for inspection sensitivity validation.

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如您有任何疑問,请在此留下詳細需求或問題,我們將竭誠您服務。

* 這些欄位為必填項目。

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