Raman

Raman Solution by Hardware Feature

By combining advanced hardware innovations with user-focused software, HORIBA delivers instruments that adapt to a wide range of applications — from routine analysis to the most challenging scientific demands.

Whether enabling faster imaging, nanoscale chemical mapping, or precise in-situ monitoring, HORIBA’s technologies are built to support your research with reliability, precision, and ease of use.

Download our brochure | Contact us


Fast Imaging

Fast imaging is a rapid chemical mapping technique designed to acquire spatially resolved Raman data across a sample surface in a fraction of the time required by traditional point-by-point mapping.

It works by synchronizing a moving motorized stage with high-speed spectral acquisition, allowing the system to collect full Raman spectra at each pixel while scanning the sample at high speed.

This approach reduces acquisition time while preserving spectral integrity, making it ideal for high-throughput analysis and real-time visualization in many fields such as material science, semiconductors or life science.

LabRAM Soleil

QScan™ is a quick point-by-point mapping mode, ideal for small-area, high-resolution scans. It moves the laser spot using galvanometric mirrors instead of physically moving the stage, enabling fast and precise raster scanning without mechanical movement—perfect for delicate or uneven samples.

Combined with easy-out-of-the-box-use LabSpec 6’s software functionalities such as Smart Sampling and SWIFT, Fast Imaging enhances the performance of the Raman spectrometer through automation and great user experience.

  • SmartSampling™ is a targeted mapping technique that automatically focuses data collection on regions of interest identified through visual contrast and intensity thresholds. It skips uniform or uninformative areas, which reduces acquisition time and improves mapping efficiency.
     
  • SWIFT™ (Scanning With Intelligent Fast Technology) is HORIBA’s ultra-fast Raman imaging mode, which acquires spectra while the stage moves continuously. By combining speed with full spectral data at each pixel, SWIFT™ is ideal for high-throughput, large-area mapping with excellent spectral integrity.
     

Discover the technology through some of our resources:

 

TERS - Nanoscale Chemical Imaging

TERS (Tip-Enhanced Raman Spectroscopy) combines Raman spectroscopy with Atomic Force Microscopy (AFM) to achieve nanoscale chemical imaging, far beyond standard Raman resolution. A metal-coated AFM tip concentrates laser light into a localized “hot spot,” enhancing the Raman signal from features as small as molecules or defects.

AFM-Raman XploRA Nano

HORIBA’s TERS-ready systems integrate high-stability AFM hardware, precise optical alignment, and vibration isolation to ensure reliable, high-resolution performance.
This advanced capability is ideal for materials science, semiconductors, and biomaterials, offering detailed structural and chemical insights at the nanometer scale.

Discover the technology through some of our resources:

Ultra-Low Frequency (ULF) Raman

Ultra-Low Frequency (ULF) Raman enables Raman measurements down to 5 cm⁻¹, giving access to low-frequency vibrations without sacrificing speed or spectral range.

Ultra-Low Frequency (ULF) module

Unlike standard Raman setups, this built-in hardware makes low-frequency Raman accessible on a compact, routine Raman microscope. It maintains high throughput of a single spectrometer and captures both Stokes and Anti-Stokes signals simultaneously.

It unlocks new insights into materials in pharmaceutical polymorphs, carbon nanotubes and other advanced materials, where ultra-fine spectral details reveal critical structural information.

Discover the technology through some of our resources:

In-situ Measurements

In-situ analysis means observing and measuring real-time chemical or structural changes as they happen—directly in the environment where the process occurs, without moving or damaging the sample.

Environmental Raman Stages

Whether the sample needs heating, cooling, applying pressure, exposure to light, or working in a gas or liquid environment, HORIBA’s systems can be equipped with specialized sample stages, environmental cells, and reaction chambers. These systems allow for precise measurements under controlled environments (temperature, humidity, or pressure)while the sample is under actual operating conditions.

This method is suitable for catalysis, battery testing, polymers, semiconductors, 2D materials, and more.

Discover the technology through some of our resources:

Large Wafer Handling

HORIBA Raman spectrometers are specifically optimized for semiconductor applications, offering advanced capabilities for defect inspection, uniformity analysis, and process control.

LabRAM Odyssey Semiconductor

With modular, flexible platforms and high-precision motorized stages, they can accommodate wafers up to 300 mm (12 inches). This large-area handling enables automated, high-resolution mapping across the entire wafer surface, making HORIBA systems ideal for both research and in-line quality control in semiconductor manufacturing.

Discover the technology through some of our resources:

High NIR Sensitivity

HORIBA Raman spectrometers offer high NIR sensitivity to minimize fluorescence, and enable deeper, non-destructive analysis—ideal for challenging samples in life sciences, polymers, and cultural heritage.

MacroRAM Affordable Benchtop Raman Spectrometer

This is achieved using different hardware components that work together to deliver strong Raman signals even in low-light or high-background conditions. By reducing noise and enhancing signal quality in the near-infrared range, HORIBA systems provide clear, reliable spectra for applications where standard Raman often struggles, such as analyzing biological tissues, ancient inks, or fluorescent materials.

Discover the technology through some of our resources:

Collaborative Correlative Microscopy

Raman and Scanning Electron Microscopy (SEM) are complementary techniques for characterization of complex samples.

HORIBA patented nanoGPS navYX is a versatile, quick and affordable solution to relocate sample’s points of interest with micron accuracy, even in distant laboratories.
Combined with graphYX correlative microscopy software, it provides a complete solution for characterization of micro and nanomaterials, edition of multimodal maps and facilitates collaborative work thanks to a traceable workflow.

Discover the technology into the page dedicated to our Collaborative Correlative Microscopy solutions.

Request for Information

Do you have any questions or requests? Use this form to contact our specialists.

* These fields are mandatory.

Corporate