Dark field microscopy is primarily a contrast enhancement imaging technique on microscopes. Its contrast enhancement benefit derives from the design of the collection optics of the microscope to only collect scattered light from the target of interest. This design automatically removes the ambient background light that would otherwise overwhelm the image and reduce the image contrast, as in bright field microscopy.
Although developed as a contrast enhancement modality for microscope imaging, dark field has proven to be quite useful as an analytical spectroscopic technique - especially for new developments in micro and nano-engineered materials. This is because the optical scattering properties of any particle is directly related to the material properties of that particle. Moreover, since the dark field technique only looks at scattered light, spectroscopic analysis of the scattered light can provide a wealth of information about the scattering target - from its size to its composition.
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