Resolving micron-sized layers in multilayer films with Raman microscopy by cross-section analysis and confocal depth profiling
Multilayer polymer films, composed of different materials, are used in a variety of industrial applications. The analysis of these multilayers is important to support, especially for safety and performances control. Here, we use Raman microscopy by cross-section analysis and confocal depth profiling to investigate the chemical composition of two multilayers films.