Job Specification - HORIBA

Corporate Korea

Products
Applications
Technologies
- Spectroscopy
  Cathodoluminescence
  Raman Spectroscopy
  AFM-Raman
  Fluorescence Spectroscopy
  Photoluminescence Spectroscopy
  Vaccum Ultra Violet
  Diffraction Gratings
  Monochromator and Spectrograph
  Detectors
  X-ray Fluorescence Spectroscopy (XRF)
  Spectroscopic Ellipsometry
- Microscopy and Imaging
  Raman Microscopy
  Cathodoluminescence
  Atomic Force Microscopy [AFM]
  AFM-Raman
  Nanoparticle Tracking Analysis
- Electrochemistry
  The Story of pH (Link to dedicated website)
  The Story of Ion
  The Story of ORP
  The Story of Conductivity
  The Story of Salt
  The Story of Dissolved Oxygen
- Physisorption
  Surface Area Measurements
- Particle Analysis
  Dynamic Light Scattering
  Static Light Scattering
  Molecular Weight
  Zeta Potential
  Image Analysis of Particles
  Nanoparticle Tracking Analysis
  Centrifugal Sedimentation
- Elemental Analysis
  Glow Discharge Optical Emission Spectroscopy (GDOES)
  Inductively Coupled Plasma - Optical Emission Spectroscopy (ICP-OES)
  Carbon/Sulfur & Oxygen/Nitrogen/Hydrogen Analysis
  X-ray Fluorescence Spectroscopy (XRF)
- Surface Plasmon Resonance
  Surface Plasmon Resonance imaging
Resources
Support
Contact

Country / Region

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Products

By Products (A-Z)
Automotive
Medical
Process and Environment
Scientific
Semiconductor

Applications

Drinking Water Utilities
Automotive Manufacturing
Semiconductor Manufacturing Process
Research and Testing Laboratories

Technology

Glow Discharge Spectroscopy
Pressure-based Flowmetry
Quadrupole Mass Spectrometry
Raman Spectroscopy

Service

On-Site Support
Spare Parts and Consumables

Company

News
Events
Career
History
Corporate Culture

Contact

Career Contact
Contact Form
Worldwide Locations
Investor Relations Contact

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