Applications

Correlated TERS and KPFM of Graphene Oxide Flakes

Nano-localization of Chemical Groups in Graphene Oxide Flakes

Correlated TERS and KPFM of Graphene Oxide Flakes

Visualizing the distribution of structural defects and functional groups present on the surface of two-dimensional (2D) materials such as graphene oxide challenges the sensitivity and spatial resolution of most advanced analytical techniques.

AFM-Raman and its TERS mode are used to show nanoscale surface mapping of structural defects and chemical groups on graphene oxide (GO) flakes with 10 nm spatial resolution. TERS mapping is combined with Kelvin probe force microscopy measurements for simultaneous topographical, electronic and chemical imaging of GO surface. The multi-parameter measurement methodology proposed in this note extends the capability of TERS allowing a direct correlation of local chemical composition and physical properties at the nanoscale not only for 2D materials but for almost any sample surface.

Related Products

XploRA Nano
XploRA Nano

AFM-Raman for Physical and Chemical imaging

LabRAM Odyssey Nano
LabRAM Odyssey Nano

AFM-Raman for physical and chemical imaging

OmegaScope
OmegaScope

The AFM optical platform

LabRAM Soleil Nano
LabRAM Soleil Nano

Real-time and Direct Correlative Nanoscopy

TRIOS
TRIOS

Versatile AFM Optical Coupling

Wniosek o udzielenie informacji

Masz pytania lub prośby? Skorzystaj z tego formularza, aby skontaktować się z naszymi specjalistami.

* Te pola są obowiązkowe.

Corporate