Precise Editing on Graphene Surface

Related Information

AFM Optical Platform

The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (TERS, TEPL), but also for truly co-localized AFM-Raman measurements.
 

Požadavek na informaci

Máte nějaké dotazy nebo požadavky? Pomocí tohoto formuláře kontaktujte naše specialisty.

* Tato pole jsou povinná.

Corporate