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Material Characterization

Measuring techniques are necessary for the analysis and development of next-generation materials. HORIBA supports your new material development and quality control with specialized measuring techniques.

Overview of All Material Interests:

Film thickness
  • Spectroscopic Ellipsometry
  • Reflectometry
  • X-Ray Fluorescence
  • GD-OES/

 

 

 Optical Constants
  • Spectroscopic Ellipsometry
  • Reflectometry
   Band gap
  • Spectroscopic Ellipsometry
  • Photoluminescence
  • Fluorescence
Roughness
  • Spectroscopic Ellipsometry
  • AFM
  • Raman-AFM
   Crystallinity
  • Spectroscopic Ellipsometry
  • Raman Spectroscopy
  • Raman-AFM
   Stoichiometry
  • Spectroscopic Ellipsometry
  • Raman Spectroscopy
  • Raman-AFM
  • AFM
Stress/Strain
  • Raman Spectroscopy
  • Cathodoluminescence
   Defect Analysis
  • Raman Spectroscopy
  • Photoluminescence
  • Cathodoluminescence
  • X-Ray Fluorescence
  • AFM
  • Raman-AFM
   Impurity Analysis
  • Raman Spectroscopy
  • Raman-AFM
  • Photoluminescence
  • Cathodoluminescence
  • X-Ray Fluorescence
  • GD-OES
  • PP-TOFMS
  • Instrumental Gas Analyzers
Doping Concentration
  • Photoluminescence
  • PP-TOFMS
   Carrier Concentration
  • Photoluminescence
  • Instrumental Gas Analyzers
  • GD-OES
  • AFM
  • Raman-AFM
   Elemental Composition
  • X-Ray Fluorescence GD-OES
  • PP-TOFMS
  • Instrumental Gas Analyzers
Chemical Identification
  • Raman Spectroscopy
  • Raman-AFM
   Chemical Concentration
  • Raman Spectroscopy
  • Chemical Concentration Monitors
   Carrier Lifetime
  • Fluorescence
Surface Potential
  • AFM
  • Raman-AFM
   Layers of 2D Materials
  • Spectroscopic Ellipsometry
  • Raman Spectroscopy
  • Photoluminescence
  • AFM
  • Raman-AFM
   Electrical Properties
  • AFM
  • Raman-AFM
Particle Analysis
  • Particle size analyzers
        

 

Film Thickness

more UVISEL Plus In-Situ

In-situ spectroscopic ellipsometer for real-time thin film monitoring

more Spectroscopic Ellipsometer - In-Line

In-Line Spectroscopic Ellipsometer for Web Coater and Roll to Roll Systems

more Auto SE

Spectroscopic Ellipsometer for Simple Thin Film Measurement

Band Gap

more Fluorolog-QM

Modular Research Fluorometer for Lifetime and Steady State Measurements

more Duetta

Fluorescence and Absorbance Spectrometer

Stress / Strain

more LabRAM HR Evolution

Confocal Raman Microscope

Defect Analysis

more Cathodoluminescence - CLUE Series

Cathodoluminescence Solutions for Electron Microscopy

more iHR Series

Mid-Focal Length Imaging Spectrometers

more LabRAM HR Evolution

Confocal Raman Microscope

more LabRAM Soleil

Raman Microscope

Elemental Composition

more GD-Profiler 2™

Discover a Whole New World of Information with Glow Discharge Optical Emission Spectrometer

more Plasma Profiling TOFMS

Ultra-Fast, Sensitive and High Resolution Depth Profiling technique

more EMGA-920

Oxygen/Nitrogen Analyzer

Chemical Identification

more XGT-9000

X-ray Analytical Microscope (Micro-XRF)

Carrier Lifetime

more DeltaFlex

TCSPC Lifetime Fluorometer

Layers of 2D Materials

more XploRA Nano

AFM-Raman for Physical and Chemical imaging

Particle Analysis

more ViewSizer 3000

Multi-Laser Nanoparticle Tracking Analysis (NTA)

Corporate