This work presents a combined analytical approach using GD-OES with an Ar/O₂ gas mix, alongside Raman spectroscopy and micro-XRF, to characterize the surface of inner layer in complex organic/inorganic multilayer coatings. The Ar/O₂ mixture enables uniform sputtering by GD-OES, while Raman and micro-XRF provide non-destructive surface characterization inside the crater. Identical Raman spectra and consistent XRF signals confirm no chemical alteration, validating the integrity of the layers. This synergy allows researchers to access and analyze underlayers with high confidence. The method is ideal for advanced applications such as automotive coatings, offering precise depth profiling and enhanced material evaluation for R&D and quality control.
Pulsed-RF Glow Discharge Optical Emission Spectrometer
MicroRaman Spectrometer - Confocal Raman Microscope
X-ray Analytical Microscope (Micro-XRF)
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