
2D Materials

Correlated PL and ULF Raman microscopies of WS2 sample
2D materials are state of the art in nano- and opto-electronics. Characterizing their structural properties with a non-destructive approach at the micron scale is an important point.
Download application note: Structural characterization of WS₂ flakes by Photoluminescence and ultra-low frequency Raman spectroscopy on a unique multimode platform









