Search
English
Corporate
Products
Raman Imaging and Spectrometers
Raman Solution by Activity
Raman Solution by Hardware Feature
Raman Software Solutions
拉曼應用
Raman Academy
Browse Products
LabRAM Soleil
XploRA PLUS
LabSpec 6 Spectroscopy Suite Software
AFM Optical Platform
Browse Products
SignatureSPM
OmegaScope
SmartSPM
TRIOS
XploRA Nano
LabRAM Nano
LabRAM Soleil Nano
CombiScope
螢光光譜
穩態螢光
TCSPC 的螢光壽命
螢光顯微鏡
瀏覽產品
Aqualog
DeltaFlex TCSPC
DeltaPro TCSPC
Duetta
FLIMera
Fluorolog-QM
FluoroMax
InverTau
Nanolog
Veloci
X射線螢光光譜儀 [XRF]
應用
XGT-9000 | X-ray Analytical Microscope
XGT-9000SL | X-ray Analytical Microscope Super Large Chamber Model
MESA-50 | X-Ray Fluorescence Analyzer
MESA-50K | X-Ray Fluorescence Analyzer
Glow Discharge Optical Emission Spectrometry (GDOES)
GD-Profiler 2
ICP-OES 光譜儀
Ultima Expert
Ultima Expert LT
碳、硫、氧、氮和氫元素分析儀
Application corner
EMIA-Expert | C/S Analyzer
EMIA-Pro | C/S Analyzer
EMIA-Step | C/S Analyzer
EMGA-Expert (EMGA-30E/20E) | O/N/H Analyzer
EMGA-Expert (EMGA-21E) | H Analyzer
EMGA-Pro (EMGA-20P) | O/N/H Analyzer
Sulfur-in-Oil
Sulfur-in-Oil Home
Energy Dispersive X-ray Fluorescence
Combustion Elemental Analysis
Browse All Products
SLFA-60
SLFA-6000
MESA-7220V2
MESA-7220
顆粒表徵
粒徑尺寸
顆粒形狀
Zeta 電位
表面積
顆粒濃度
瀏覽全部產品
Partica LA-960V2
Partica mini LA-350
ViewSizer 3000
nanoPartica SZ-100V2 Series
客製化光譜解決方案
模組化拉曼
光致發光
顯微鏡光譜儀
暗場散射
電致發光和光電流
反射率和透射率
時間分辨光致發光（使用壽命）
微光致發光
顯微拉曼光譜
半導體大晶圓分析
Micro-LED Analysis
時間分辨螢光
陰極發光
光源
光譜儀和單色儀
科學相機和單通道偵測器
OEM 的微型光譜儀和科學相機
光柵光譜儀
OEM Deep-Cooled Scientific Cameras
Diffraction Gratings for Industrial OEM and Scientific Research
Gratings for Industrial OEM
Gratings for Scientific Research
Surface Plasmon Resonance imaging (SPRi)
OpenPleX
SPRi-Arrayer
Spectroscopic Ellipsometry
UVISEL Plus
Auto SE
Smart SE
Forensics
應用
汽車與航空
Semiconductors
材料科學
Biotechnology and Biomedical
生物製藥
化妝品
食品及飲料
Environment
Energy
Chemistry
Metallurgy
Others
Technologies
Spectroscopy
Cathodoluminescence
Raman Spectroscopy
AFM-Raman
Fluorescence Spectroscopy
Photoluminescence Spectroscopy
Diffraction Gratings
Monochromator and Spectrograph
Detectors
X-ray Fluorescence Spectroscopy (XRF)
Spectroscopic Ellipsometry
Microscopy and Imaging
Raman Microscopy
Cathodoluminescence
Atomic Force Microscopy [AFM]
AFM-Raman
Nanoparticle Tracking Analysis
Particle Analysis
Dynamic Light Scattering
Static Light Scattering
Molecular Weight
Zeta Potential
Image Analysis of Particles
Nanoparticle Tracking Analysis
Centrifugal Sedimentation
Elemental Analysis
Glow Discharge Optical Emission Spectroscopy (GDOES)
Inductively Coupled Plasma - Optical Emission Spectroscopy (ICP-OES)
Carbon/Sulfur & Oxygen/Nitrogen/Hydrogen Analysis
X-ray Fluorescence Spectroscopy (XRF)
Surface Plasmon Resonance
Surface Plasmon Resonance imaging
Resources
eBooks
Webinars
Videos On Demand
Science in Action Series
Women in Science Series
Spectroscopy Matters
Nobel Laureate Connections
Jobin Yvon History - 200 Years of Optical Innovation
Events
In the Media
Career
Support
Worldwide Locations
Contact
Country / Region
Change
聯絡我們
找到我們
HORIBA
»
Scientific
» Resources »
Career
Oops, an error occurred! Code: 20260405192814fb2dee17
聯絡我們
Corporate