HORIBA Scientific pulsed RF GDOES instruments have unique features supported by multiple patents that make them the ideal companion characterization tools to material research and elaboration.
The new RF pulsed source allows measuring all types of solid samples conductive or non, even fragile or heat sensitive with optimum performances.
The patented High Dynamic range Detectors (HDD) used in all HORIBA Scientific GD instruments allow real time, automatic optimization of the sensitivity permitting to analyze elements at trace levels in one layer and as major in a second layer without compromise or need of pre-adjustment.
Pulsed RF GD OES will answer in minutes – even seconds to multiple questions such as:
With their ~20 % efficiency, hybrid perovskite solar cells are the new promising candidate for next generation photovoltaics. Thanks to the wide HORIBA Scientific portfolio, different techniques can be used to gain in depth knowledge on the optoelectronic properties and mechanisms of this class of materials. In this application note we decided to use spectroscopic ellipsometry, steady-state and time-resolved fluorescence and Glow Discharge Optical Emission Spectroscopy to investigate the properties of CH3NH3PbI3 thin films deposited on a spin-coated PEDOT:PSS. The impact of the exposure to air was addressed.
Pulsed RF Glow Discharge Optical Emission Spectrometry offers ultra-fast elemental depth profiling capability for the investigation of thin and thick films. Thanks to the use of a pulsed RF source, coupled with a high resolution optical spectrometer, the GD Profiler 2 provides an excellent depth resolution, allowing the fast evaluation of the coating quality. In this application note, we focus on a MoS2/Pb composite multilayered sample, used as a solid lubricant. The analysis of such a sample shows the excellent performance of this instrument for the study of nm-thick complex coatings.