Scientific

X-ray Fluorescence Analyzers [XRF]

HORIBA’s XGT systems offer high performance energy dispersive X-ray fluorescence (EDXRF) analysis with unique capabilities. The patented XGT (X-Ray Guide Tube) technology combines traditional X-ray fluorescence methodology with small spot analysis. High intensity X-ray beams with diameters ranging from 3 mm down to a unique 10 µm offer versatile analysis capabilities. Full qualitative and quantitative elemental analysis is possible, even on individual microscopic particles, whilst mapping analysis provides detailed element distribution images.

Applications benefiting from HORIBA’s X-ray fluorescence technology include forensics, geology, materials, biology/medicine, electronics, archaeology, engine wear analysis, pharmaceutics, and RoHS/ELV compliance testing.

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XGT-9000
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X-ray Analytical Microscope

MESA-50
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X-Ray Fluorescence Analyzer

MESA-50K
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X-Ray Fluorescence Analyzer

Featured

Technical Note - The New HORIBA XGT-9000: An Overview

In this technical note we present the features of the XGT-9000, the new X-ray microscope from HORIBA. We show its versatility through some examples of the application domains which could benefit from a micro X-ray fluorescence analysis.

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On-demand Webinar: Application of Micro-XRF Spectroscopy

The basic principles of X-ray fluorescence and instrumentation for micro-XRF spectroscopy will be discussed in this presentation.

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XGT 9000 X-ray Analytical Microscope Basic Operation

XGT-9000 Features and Operations Video

The evolution of μXRF! Combination of improved sensitivity and new imaging technology achieved high speed analysis of foreign materials in only one unit.

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Application: The non-destructive identification of black ink in a tempered document using XGT-9000

μ-XRF is one of the powerful non-destructive analytical technique in forensic science application. Thanks to the elemental mapping and the spectrum search function, XGT-9000 enables to reveal intentional alternation and identify the ink used on a document.

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Application: Non-destructive Failure Analysis on Electronic Components Using the XGT-9000

μ-XRF is a non-destructive analytical technique which can inspect defects, even non-visible ones, inside a sample because of the high penetration of X-rays. This application note introduces failure analysis to detect ion migration, voids, and foreign matter on electronics using the XGT-9000, with key features of the vertical irradiation of a 10 μm probe and the simultaneous imaging of fluorescent X-rays and transmission X-rays.

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Application: Spectroscopic Analysis Explains the Mystery of Dragonfly Eye Beads

Spectroscopic analysis can reveal the origin of cultural heritages and the historical background at the time. This application note introduces research of a dragonfly eye bead found in a tomb in China. Using Raman spectroscopy and X-ray analytical microscopy, the bead was found to be from the Eastern Mediterranean region and the result suggested China had cultural and economic exchanges with them during that era.

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Application corner

The unique features and high performance of the XGT series has opened up the micro-XRF technique to a wide and varied range of applications where fast and accurate elemental analysis can solve problems and shed light on the complexities of nature.

Technology

HORIBA is experts in X-Ray Fluorescence (XRF) micro-analysis, and can propose high performance solutions for spatially resolved XRF analysis with analysis spot sizes as low as 10 µm.

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