Defect / Impurity Monitoring

The photoluminescence method can evaluate the composition, defects, quantum wells, impurities, crystallinity of compound semiconductors in a non-destructive and non-contact manner. In silicon semiconductors, it is used for analyzing trace impurities in silicon.

We can meet a wide range of needs, from basic research to mapping measurements for quality inspections, with our customization capabilities unique to a spectrometer manufacturer.

 

LabRAM HR Evolution
LabRAM HR Evolution

Confocal Raman Microscope

LabRAM Soleil
LabRAM Soleil

Multimodal Confocal Raman Microscope

SMS
SMS

Add Spectroscopy to ANY Microscope

XGT-9000
XGT-9000

X-ray Analytical Microscope (Micro-XRF)

XGT-9000SL
XGT-9000SL

X-ray Analytical Microscope
with a Super Large Chamber

Informationsanfrage

Sie haben Fragen oder Wünsche? Nutzen Sie dieses Formular, um mit unseren Spezialisten in Kontakt zu treten.

* Diese Felder sind Pflichtfelder.

Corporate