Material Characterization

Measuring techniques are necessary for the analysis and development of next-generation materials. HORIBA supports your new material development and quality control with specialized measuring techniques.

Overview of All Material Interests:

Film thickness
  • Spectroscopic Ellipsometry
  • Reflectometry
  • X-Ray Fluorescence
  • GD-OES/

 

 

 Optical Constants
  • Spectroscopic Ellipsometry
  • Reflectometry
   Band gap
  • Spectroscopic Ellipsometry
  • Photoluminescence
  • Fluorescence
Roughness
  • Spectroscopic Ellipsometry
  • AFM
  • Raman-AFM
   Crystallinity
  • Spectroscopic Ellipsometry
  • Raman Spectroscopy
  • Raman-AFM
   Stoichiometry
  • Spectroscopic Ellipsometry
  • Raman Spectroscopy
  • Raman-AFM
  • AFM
Stress/Strain
  • Raman Spectroscopy
  • Cathodoluminescence
   Defect Analysis
  • Raman Spectroscopy
  • Photoluminescence
  • Cathodoluminescence
  • X-Ray Fluorescence
  • AFM
  • Raman-AFM
   Impurity Analysis
  • Raman Spectroscopy
  • Raman-AFM
  • Photoluminescence
  • Cathodoluminescence
  • X-Ray Fluorescence
  • GD-OES
  • PP-TOFMS
  • Instrumental Gas Analyzers
Doping Concentration
  • Photoluminescence
  • PP-TOFMS
   Carrier Concentration
  • Photoluminescence
  • Instrumental Gas Analyzers
  • GD-OES
  • AFM
  • Raman-AFM
   Elemental Composition
  • X-Ray Fluorescence GD-OES
  • PP-TOFMS
  • Instrumental Gas Analyzers
Chemical Identification
  • Raman Spectroscopy
  • Raman-AFM
   Chemical Concentration
  • Raman Spectroscopy
  • Chemical Concentration Monitors
   Carrier Lifetime
  • Fluorescence
Surface Potential
  • AFM
  • Raman-AFM
   Layers of 2D Materials
  • Spectroscopic Ellipsometry
  • Raman Spectroscopy
  • Photoluminescence
  • AFM
  • Raman-AFM
   Electrical Properties
  • AFM
  • Raman-AFM
Particle Analysis
  • Particle size analyzers
        

 

Film Thickness

UVISEL Plus In-Situ
mehr UVISEL Plus In-Situ

In-situ spectroscopic ellipsometer for real-time thin film monitoring

Spectroscopic Ellipsometer - In-Line
mehr Spectroscopic Ellipsometer - In-Line

In-Line Spectroscopic Ellipsometer for Web Coater and Roll to Roll Systems

Auto SE
mehr Auto SE

Spectroscopic Ellipsometer for Simple Thin Film Measurement

Band Gap

Fluorolog-QM
mehr Fluorolog-QM

Modular Research Fluorometer for Lifetime and Steady State Measurements

Duetta
mehr Duetta

Fluorescence and Absorbance Spectrometer

Stras / Strain

LabRAM HR Evolution
mehr LabRAM HR Evolution

Confocal Raman Microscope

Defect Analysis

Cathodoluminescence - CLUE Series
mehr Cathodoluminescence - CLUE Series

Cathodoluminescence Solutions for Electron Microscopy

iHR Series
mehr iHR Series

Mid-Focal Length Imaging Spectrometers

LabRAM HR Evolution
mehr LabRAM HR Evolution

Confocal Raman Microscope

LabRAM Soleil
mehr LabRAM Soleil

Raman Microscope

SMS
mehr SMS

Add Spectroscopy to ANY Microscope

Elemental Composition

GD-Profiler 2™
mehr GD-Profiler 2™

Discover a Whole New World of Information with Glow Discharge Optical Emission Spectrometer

Plasma Profiling TOFMS
mehr Plasma Profiling TOFMS

Ultra-Fast, Sensitive and High Resolution Depth Profiling technique

EMGA-920
mehr EMGA-920

Oxygen/Nitrogen Analyzer

ICP-OES
mehr ICP-OES

Complete your ICP-OES Spectrometer for your specific needs

Chemical Identification

XGT-9000
mehr XGT-9000

X-ray Analytical Microscope (Micro-XRF)

XGT-9000SL
mehr XGT-9000SL

X-ray Analytical Microscope Super Large Chamber Model

Carrier Lifetime

DeltaFlex
mehr DeltaFlex

TCSPC Lifetime Fluorometer

Layers of 2D Materials

XploRA Nano
mehr XploRA Nano

AFM-Raman for Physical and Chemical imaging

LabRAM Nano
mehr LabRAM Nano

AFM-Raman for physical and chemical imaging

Particle Analysis

ViewSizer 3000
mehr ViewSizer 3000

Simultaneous Multi-Laser Nanoparticle Tracking Analysis (NTA)

Informationsanfrage

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