Material Characterization

Ultra-thin film makes it difficult to measure film thickness and refractive index

Exhibition Panels

PDF

1.08 MB

Material & Thin Film Characterization

Various analytical measurement technologies for evaluation of physical properties and thin films

PDF

3.29 MB

Chemical Mechanical Planarization

Various analytical measurement technologies in the CMP process

Product Catalogs

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3.18 MB

Scientific Product Navi

Your Partner in Science

PDF

4.34 MB

Semiconductor Navi

Smart Car

PDF

1.49 MB

Raman Navi

Product Lineup of Raman Spectroscopy

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6.76 MB

Raman Spectrometer

LabRAM HR Evolution

PDF

7.24 MB

Raman Microscope

LabRAM Soleil

PDF

10.61 MB

AFM Raman

Nano Raman

PDF

1.11 MB

Raman Spectrometer

MacroRAM

PDF

4.09 MB

Ellipsometer for Thin Film Measurements

UVISEL Plus

PDF

1.75 MB

Spectroscopic Ellipsometer for Simple Thin Film Measurement

Auto SE

PDF

5.85 MB

Glow Discharge Optical Emission Spectrometer

GD Profiler

PDF

5.18 MB

Cathodoluminescense

CLUE Series

PDF

5.14 MB

Fluorescence Spectrometer

Fluorolog QM

PDF

5.28 MB

TCSPC Lifetime Fluorometer

DeltaFlex

PDF

1.7 MB

Fluorescence and Absorbance Spectrometer

Duetta

PDF

1.85 MB

Centrifugal Nanoparticle Analyzer

Partica CENTRIFUGE

PDF

1.52 MB

Nanoparticle Analyzer

Nano Partica SZ-100V2 Series

PDF

1.52 MB

Laser Scattering Particle Size Distribution Analyzer

Partica LA-960V2

PDF

1.52 MB

Laser Scattering Particle Size Distribution Analyzer

Partica LA-960V2 Series Optional

PDF

6.71 MB

Oxygen & Nitrogen Analyser

EMGA-Pro / Expert

PDF

1.84 MB

X-Ray Analytical Microscope

XGT-9000

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