
Cathodoluminescence
Latest News
HORIBA Scientific Introduces New Clue Series Detectors For Scanning Electron Microscopes
HORIBA CLUE Series offer a scalable platform for imaging and spectroscopic analysis of nano-objects with SEM and dual SEM/FIB (Focused Ion Beam) microscopes.
HORIBA Scientific, global leader in spectroscopic analysis for over 40 years, is proud to announce the new HORIBA CLUE Series detectors for Scanning Electron Microscopes (SEM).
Exhibitions
MMC - Microscience Microscopy Congress 2017Event Dates: 3 July 2017 - 6 July 2017Location: Manchester, UK Website: http://mmc-series.org.uk |
15éme colloque de la socité française des microscopies Event dates: 4 July 2017 -7 July 2017 |
Semicon West 2017
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2017 Chinese National Conference on Surface Science and Technology and summer school Event dates: 13 August 2017 - 15 August 2017 |
JASISEvent dates: 6 September 2017 - 8 September 2017 |
ICES 2017 International Conference on Enhanced Spectroscopies 2017 Event dates: 4 September 2017 - 7 September 2017 |
E-MRS Fall MeetingEvent dates: 18 September 2017 -21 September 2017 |
ECASIA 2017 (17th European Conference on Applications of Surface and Interface Analysis) Event dates: 24 September 2017 - 29 September 2017 |
POWTECH 2017Event dates: 26 September 2017 - 28 September 2017 |