XGT-5200WR X-ray Analytical and Imaging Microscope

Vue d'ensemble

XGT-5200WR are specially designed for WEEE/RoHS, ELV and Chinese RoHS for the high sensitivity measurement of 5 elements (Pb/Cd/Cr/Hg/Br) and equipped X-ray Microscope Functions

With the unique X-ray Guide Tube the bench top XGT-5200 systems allow convenient access to X-ray fluorescence analysis with high spatial resolution – from 1.2mm down to 10 µm(HORIBA original). Two X-ray guide tubes (1.2mm and 100 µm are standard, 10 µm is optional instead of 100 µm) are provided in the instrument, allowing the user to simply switch between a micro and macro beams, so that a range of experiments can be accommodated.

There is no sample preparation or vacuum required – the object is simply placed in the sample chamber and analysed at normal atmospheric pressure.

Fully integrated software controls sample movement, acquisition options and data analysis (including qualitative and quantitative analysis, and composite image generation). From when a sample is put in the chamber, just a few seconds are needed until an acquisition is started, aided by intuitive “point and click” selection of the analysis position.

XRF mapping images are easily obtained through automated sample scanning, and the provision of a second detector beneath the sample enables simultaneous acquisition of X-ray transmission images. The additional structural information provided by this technology is extremely useful for locating regions of interest, or interrogating a sample's internal structure.

XGT-5200WR is equipped with dewar of liquid nitrogen.
XGT-5200WR Type S/SL model with big sample room are lineuped. 

Fabriqué par HORIBA





Energy dispersive X-ray fluorescence analyzer


Na to U (in sample atmosphere)


Plastic, metal, paper, liquid such as paint and ink, biological samples etc

Sample chamber atmosphere


XGT Element Spatial Resolution

1,2mm + 100µm or 1,2mm + 10µm

X-ray tube

50kV/1mA, Rh target

Vacuum probe


Primary X-ray Filter

Ø1,2mm: 5WR elements simultaneous filter (Cd/Pb/Cr/Hg/Br)
Ø1,2mm(Optional): Multifilter with 4 specific filters (Cd/Cr,Cl/5WR elements/No filter)
Ø100µm: Filter less
Ø10µm: Filter less

Secondary X-ray filter



Peltier cooled Silicon Drift Detector (SDD)
Transmission X-ray detector: NaI(Ti)scintillator


100mm×100mm(Maximum mapping area), 200mm×200mm(Optional)

Sample chamber

400×350×40mm(Additional special order is possible)

Optical image

Entire image: 100mm×100mm (Standard:400,000 pixels, Optional: 2million pixels)
Detailed image: Pbservation by 100X magnification (Coaxial)

Analysis functions

Qualitative: Automatic qualitative function, BG display, ROI classification by color, Mutching function
Quantitative: FPM, Analytical curve, Hazardous elements (Cl, thichness qnd cable compensation)
Meas.sequence: Condition setting, Meas, Quantitative anal

Data management(Optional)

Excel® data management software, Ecological procuremet supporting software and an Inspection report output

Power Supply

AC100, 120, 220, 240V  50/60Hz

Power Comsumption

1,3kVA or lower


Approx 280kg

Outer dimensions

Analyzing unit: 680(W)833(D)670(H)mm


XGT-5200WR Dimensional Outline Drawing

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