The photoluminescence method can evaluate the composition, defects, quantum wells, impurities, crystallinity of compound semiconductors in a non-destructive and non-contact manner. In silicon semiconductors, it is used for analyzing trace impurities in silicon.
We can meet a wide range of needs, from basic research to mapping measurements for quality inspections, with our customization capabilities unique to a spectrometer manufacturer.
Microscope Confocal Raman
Spectroscope Raman - Microscope d'imagerie automatisé
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Microscope d'analyse X (Micro-XRF)
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