Production processes are evolving rapidly which is reflected in a growing need for high-grade evaluation and analysis of a wide range of thin films and complex multilayer structures. HORIBA systems are capable of measuring film properties including stress, thickness and optical constants of complex and multilayer films and ultra-thin SiO2 films.
High-Accuracy Infrared Thermometer [Built-in type]
High-Accuracy Infrared Thermometer [Built-in type]
High-Accuracy Infrared Thermometers [Stationary type]
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