SYNCERITY BI-NIR 2048 x 70 — Back Illuminated
CCD Sensor Format | 2048 x 70 |
|---|---|
Quantum Efficiency at 25°C | 60% at 500 nm 80% at 600 nm 80% at 800 nm |
Pixel Size | 14μm x 14μm |
Image Area | 28.7mm x 0.98mm, 100% fill factor |
Deep Thermoelectric Cooling | –50°C @ +25°C ambient (–60°C @ +25°C ambient, on request) |
Single Pixel Well Capacity | 50,000 e–/pixel (Minimum) 60,000 e–/pixel (Typical) |
Serial Register Full Well Capacity | 250,000e– (Minimum) 500,000 e–/pixel (Typical) |
Scan Rates | 45 kHz and 500kHz |
Readout Noise (at 45 kHz and at –50 °C) *1 | 9 e– (Typical) to 12e– (Maximum) |
Readout Noise (at 500kHz and at –50 °C) *1 | 20 e– (Typical) to 25 e– (Maximum) |
Maximum Spectral Rate | 20 Hz at 45 kHz scan rate |
Digitization | 16 bit ADC |
Dynamic Range (Typical for Serial Register) *2 | 55,500:1 |
Non Linearity (Measured on Each Camera) | 0.15% (typical) at 45 kHz (0.4% maximum) |
Dark Current at –50°C *3 | 0.05 e–/pixel/sec (Typical) |
Software-Adjustable Gains | 2, 4 & 9.5 e–/count @ -50ºC |
Environmental Conditions | • Operating Temperature 0°C to 40°C ambient |
Weight | 1.769 kg (3.90 lb) |
Dimensions | Refer to mechanical drawings |
Power Requirements | 90–264 VAC, 47–63 Hz |
Minimum Computer Requirements: | • 3.0 GHz single core or 2.4 GHz multi-core processor |
All specifications subject to change without notice.
*Q.E. from CCD manufacturer at 25ºC
1. Entire system noise measured for a single pixel
2. Dynamic range is defined as: Full Well / Readout Noise and is measured at 45 kHz
3. Averaged over CCD area, but excluding any regions of blemishes.
Quantum Efficiency – 40% at 1000nm
Syncerity BI-NIR Features an NIR-Optimized CCD (Q.E measured @ 25ºC)
Schematics
