Characterization of Carbon Nanotubes using Tip-Enhanced Raman Spectroscopy (TERS)

Characterization of Carbon Nanotubes using Tip-Enhanced Raman Spectroscopy (TERS)

The use of TERS to reveal the defects density in the structure of CNTs is of interest for a better understanding of the electrical properties of the devices made with such nano-objects.

Carbon nanotubes are now manufactured in large volumes (several thousand tons per year) and are present in many daily life products ranging from car parts, batteries, and sports equipment, to water filtration systems and boat equipment.

Nevertheless, there is still a long way to go to produce SWCNT (single wall carbon nanotube) in large scale devices with exceptional theoretical electrical and thermal conductivities and mechanical resistance. Additional knowledge is essential for boosting CNT integration into thin film microelectronics, optoelectronics, and medical devices.

Raman spectroscopy is the technique of choice to characterize CNTs and related nano-objects in terms of chirality, diameter, density, length, and presence of defects. Because conventional Raman is a far-field optical technique (the spot size is diffraction-limited), its applications are restricted to the micro- and macro-worlds. TERS bridges the gap to NanoRaman and offers nanometric spatial resolution down to the single tube level for those characteristics provided by the rich Raman spectra.

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