Key insights:
If you want to read the entire article, click here:
https://www.tabletscapsules.com/3641-Technical-Articles/624894-Particle-Size-Meets-Chemistry/
Particle size distribution (PSD) describes the range and proportion of particle sizes within a sample, typically reported using metrics such as D10, D50, and D90.
In pharmaceutical systems, PSD is a critical quality attribute (CQA) because it directly influences drug performance, manufacturability, and consistency. However, PSD alone does not reveal what the particles are made of—only how large they are.
Particle size plays a central role in dissolution rate, bioavailability, content uniformity, and processability.
Smaller particles generally dissolve faster due to increased surface area, while larger particles may improve flow properties. However, optimal performance depends on balancing these effects within a multicomponent system.
Particle size alone cannot distinguish between different materials in a formulation, such as active pharmaceutical ingredients (API) and excipients.
In complex blends, multiple components can share overlapping size distributions. Without chemical identification, it is impossible to determine which material contributes to specific regions of the PSD, limiting interpretability and decision-making.
Particle size refers to the physical dimensions of a particle, while particle chemistry defines its molecular composition.
Both are essential for understanding pharmaceutical behavior. Size influences physical performance, while chemistry determines functionality, efficacy, and regulatory compliance.
D10, D50, and D90 are statistical descriptors of a particle size distribution:
These metrics summarize distribution shape but do not provide information about particle identity.
Conventional methods such as laser diffraction and dynamic light scattering (DLS) measure particle size efficiently but lack chemical specificity.
Key limitations include:
As a result, these techniques often provide incomplete or ambiguous data in multicomponent systems.
Particle Correlated Raman Spectroscopy (PCRS) is an analytical technique that combines particle imaging with Raman spectroscopy to deliver a highly sensitive characterization without sample consumption at the individual particle level.
This approach enables simultaneous physical and chemical characterization, providing a more complete understanding of particulate systems.
Operating via a two-step integrated workflow, PCRS combines automated optical imaging for physical size detection with Raman spectroscopy for exact molecular identification of individual particles. The result is a chemically annotated particle dataset, where each particle is defined by both its size and its molecular identity.
PCRS addresses the key limitation of conventional methods by linking size data with chemistry.
This enables:
Instead of a single bulk distribution, PCRS produces component-resolved particle size distributions.
PCRS assigns a chemical identity to each measured particle, allowing PSDs to be calculated for individual components.
For example, separate distributions can be generated for:
This transforms PSD analysis from a bulk measurement into a material-specific diagnostic tool.
Particle size influences the rate at which a drug dissolves, which directly impacts bioavailability.
However, these effects must be interpreted in the context of chemical identity, since only API particles contribute to therapeutic performance.
PCRS enables root cause analysis by linking particle size features to specific materials.
For example:
This allows scientists to move from observation to actionable insight.
Multimodal distributions occur when multiple particle populations are present, often corresponding to different materials or processing conditions.
Without chemical identification, these populations cannot be definitively assigned. PCRS resolves this by separating distributions based on composition.
Differences in particle size and density between components can lead to segregation during processing. This affects content uniformity, dose accuracy, and formulation physical stability. By identifying the size distribution of each component, PCRS helps predict and mitigate segregation risks.
Advanced particle analysis provides deeper insight into formulation behavior and manufacturing consistency.
With PCRS, quality control teams can:
Traditional PSD cannot determine the origin of fines or large particles.
PCRS solves this by assigning chemical identity, enabling direct attribution:
Particle shape and morphology influence both measurement accuracy and material performance.
Irregular shapes can distort size measurements in traditional techniques, while also affecting flow and compaction. Imaging-based approaches like PCRS provide more accurate size characterization alongside morphology insight.
The primary advantage is contextualized data.
Instead of asking “What is the particle size?”, scientists can ask:
This leads to faster development, improved quality, and reduced risk.
Particle size analysis without chemistry provides incomplete insight in modern pharmaceutical systems. By integrating chemical identification with particle sizing, techniques like PCRS enable a deeper, more actionable understanding of formulation behavior, supporting both development and quality control.
| Zhu Y, Berger RF, Shen S, Sestak M, et al. Effect of reduced dimensionality on the optical band gap of SrTiO3. Appl Phys Lett. 2013. |
Sestak M. How spectroscopy is revolutionizing batteries, fuel cells, and corrosion protection. AM&P Tech Artic. 2025. |
Sestak MN. Spectroscopic Ellipsometry Studies of Cadmium Sulfide/Cadmium Telluride Thin Films and Photovoltaic Devices. 2012. |
Sestak M. How recycling turns e-waste into gold standard resources. AM&P Tech Artic. 2026. |
Desireddy A, Joshi CP, Sestak M, Little S, Kumar S, et al. Wafer-scale self-assembled plasmonic thin films. Thin Solid Films. 2011. |
Chen J, Li J, Thornberry C, Sestak MN, et al. Through-the-glass spectroscopic ellipsometry of CdTe solar cells. Paper presented at: 2009 34th IEEE Photovoltaic Specialists Conference; 2009. |
Chen J, Huang Z, Dahal LR, Sestak MN, et al. Quantum efficiency simulations from on-line compatible mapping of thin-film solar cells. Paper presented at: 2011 37th IEEE Photovoltaic Specialists Conference; 2011. |
Li J, Chen J, Sestak MN, Thornberry C, et al. Spectroscopic ellipsometry studies of thin film CdTe and CdS: from dielectric functions to solar cell structures. Paper presented at: 2009 34th IEEE Photovoltaic Specialists Conference; 2009. |
Li J, Chen J, Sestak MN, et al. Optics of CdS/CdTe thin-film photovoltaics. IEEE J Photovolt. 2011. |
Huang Z, Chen J, Sestak MN, et al. Optical mapping of large area thin film solar cells. Paper presented at: 2010 35th IEEE Photovoltaic Specialists Conference; 2010. |
Li J, Collins RW, Sestak MN, Koirala P, et al. Spectroscopic ellipsometry. In: Techniques for Thin Film... Wiley; 2016. |
Huang Z, Attygalle D, Sestak MN, et al. Application of real time spectroscopic ellipsometry for analysis of roll-to-roll fabrication of Si:H solar cells on polymer substrates. Paper presented at: 2010 35th IEEE Photovoltaic Specialists Conference; 2010. |
Sestak MN, Li J, Chen J, et al. Effects of as-deposited CdTe microstructure on solar cell performance. Paper presented at: 2010 35th IEEE Photovoltaic Specialists Conference; 2010. |
Sainju D, Li J, Podraza NJ, Sestak MN, et al. Comparison of Al/ZnO and Ag/ZnO interfaces of back-reflectors for thin film Si∶H photovoltaics. Paper presented at: 2009 34th IEEE Photovoltaic Specialists Conference; 2009. |
Sestak MN, Li J, Paudel NR, Wieland K, et al. Real-time spectroscopic ellipsometry of sputtered CdTe thin films: effect of Ar pressure on structural evolution and photovoltaic performance. MRS Online Proc Libr. 2009. |
Chen J, Aryal P, Li J, Sestak MN, et al. Through-the-glass spectroscopic ellipsometry of superstrate solar cells and large area panels. Paper presented at: 2011 37th IEEE Photovoltaic Specialists Conference; 2011. |
Huang Z, Koirala P, Aryal P, Sestak MN, et al. Optical metrology of thin film solar cells from 0.2 to 30 µm. Paper presented at: 2010 35th IEEE Photovoltaic Specialists Conference; 2010. |
Sestak MN, Yan L, Eypert C. Spectroscopic ellipsometry characterization of thin film photovoltaic materials and devices. Paper presented at: 2013 IEEE 39th Photovoltaic Specialists Conference; 2013. |
Crowley KM, Gottlieb MS, Sestak M, et al. Decoupling the effects of interfacial chemistry and grain size in perovskite stability. Paper presented at: 2021 IEEE 48th Photovoltaic Specialists Conference; 2021. |
Collins RW, Li J, Sestak MN, Marsillac S. Polarized light metrology for thin-film photovoltaics: research and development scale processes. Photovolt Int. 2011. |
Marsillac S, Sestak MN, Li J, et al. Spectroscopic ellipsometry. In: Techniques for Thin Film Photovoltaics. Wiley; 2011. |
Sestak M, Skuza J, et al. Optical and magneto-optical properties of composite noble-metal-ferromagnetic thin films. Paper presented at: APS March Meeting; 2007. |
Ash S, Dahal L, Sestak M, Collins R, et al. Improving the a-Si:H and nc-Si:H back reflectors modeled with ZnO stacks. Paper presented at: APS Ohio Sections; 2009. |
如您有任何疑問,请在此留下詳細需求或問題,我們將竭誠您服務。
