Ellipsometry provides a robust, non-destructive analysis tool for the characterisation of the thickness and quality of barrier coatings and other thin layers applied to polymer films.

Quality, ID, degree of cross linking/ cure, laminar interfaces, adhesion, contaminants, raw materials

For the determination of trace metals – either as possible contaminants or vital components of the polymer

For either R&D or QC, the LA instruments cover the range of sizes and applications.

AFM is capable of revealing surface nano-structures without disturbing their integrity. It is useful for studying the molecular composition and mechanical properties of a broad range of polymer materials. AFM, used as a nano-indentation device, proves to be a powerful tool to analyse the mechanical properties of polymers and to quantify their elastic moduli. AFM can also produce two-dimensional chemical affinity maps.