From impurities and contaminants analysis to defect analysis and process control, HORIBA offers a wide range of analytical instruments applicable to a large range of semiconductor materials, including silicon, germanium, gallium arsenide, silicon carbide, gallium nitride and others. Our robust and reliable Raman spectrometers, X-ray Fluorescence microscopes, spectroscopic ellipsometers, elemental analyzers and particle size analyzers will help you to take your semiconductor processes to the next level. Learn how HORIBA technologies and application experts can help you to maintain the highest level of productivity.   

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